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CY7C1441KV33 Arkusz danych(PDF) 30 Page - Cypress Semiconductor |
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30 / 32 page CY7C1441KV33 CY7C1443KV33 CY7C1441KVE33 Document Number: 001-66677 Rev. *I Page 30 of 32 Acronyms Document Conventions Units of Measure Table 2. Acronyms Used in this Document Acronym Description CE Chip Enable CMOS Complementary Metal Oxide Semiconductor FBGA Fine-Pitch Ball Grid Array I/O Input/Output JTAG Joint Test Action Group NoBL No Bus Latency OE Output Enable SRAM Static Random Access Memory TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TQFP Thin Quad Flat Pack WE Write Enable ECC Error Correcting Code Table 3. Units of Measure Symbol Unit of Measure °C degree Celsius MHz megahertz µA microampere mA milliampere ms millisecond mm millimeter ns nanosecond pF picofarad Vvolt Wwatt |
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