Zakładka z wyszukiwarką danych komponentów |
|
CY7C1460KV25 Arkusz danych(PDF) 10 Page - Cypress Semiconductor |
|
CY7C1460KV25 Arkusz danych(HTML) 10 Page - Cypress Semiconductor |
10 / 32 page Document Number: 001-66679 Rev. *J Page 10 of 32 CY7C1460KV25/CY7C1462KV25 CY7C1460KVE25/CY7C1462KVE25 Single Write Accesses Write access are initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, and (3) the write signal WE is asserted LOW. The address presented to the address inputs is loaded into the address register. The write signals are latched into the control logic block. On the subsequent clock rise the data lines are automatically three-stated regardless of the state of the OE input signal. This allows the external logic to present the data on DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1460KV25/CY7C1460KVE25 and DQa,b/DQPa,b for CY7C1462KV25/CY7C1462KVE25). In addition, the address for the subsequent access (read/write/deselect) is latched into the address register (provided the appropriate control signals are asserted). On the next clock rise the data presented to DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1460KV25/CY7C1460KVE25 and DQa,b/DQPa,b for CY7C1462KV25/CY7C1462KVE25) (or a subset for byte write operations, see Write Cycle Description table for details) inputs is latched into the device and the write is complete. The data written during the write operation is controlled by BW (BWa,b,c,d for CY7C1460KV25/CY7C1460KVE25 and BWa,b for CY7C1462KV25/CY7C1462KVE25) signals. The CY7C1460KV25/CY7C1462KV25/CY7C1460KVE25/ CY7C1462KVE25 provides byte write capability that is described in the Write Cycle Description table. Asserting the write enable input (WE) with the selected byte write select (BW) input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the write operations. Byte write capability has been included in order to greatly simplify read/modify/write sequences, which can be reduced to simple byte write operations. Because the CY7C1460KV25/CY7C1462KV25/ CY7C1460KVE25/CY7C1462KVE25 are common I/O devices, data should not be driven into the device while the outputs are active. The output enable (OE) can be deasserted HIGH before presenting data to the DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1460KV25/CY7C1460KVE25 and DQa,b/DQPa,b for CY7C1462KV25/CY7C1462KVE25) inputs. Doing so will three-state the output drivers. As a safety precaution, DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1460KV25/ CY7C1460KVE25 and DQa,b/DQPa,b for CY7C1462KV25/ CY7C1462KVE25) are automatically three-stated during the data portion of a write cycle, regardless of the state of OE. Burst Write Accesses The CY7C1460KV25/CY7C1462KV25/CY7C1460KVE25/ CY7C1462KVE25 have an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four WRITE operations without reasserting the address inputs. ADV/LD must be driven LOW in order to load the initial address, as described in the Single Write Accesses section above. When ADV/LD is driven HIGH on the subsequent clock rise, the chip enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BW (BWa,b,c,d for CY7C1460KV25/CY7C1460KVE25 and BWa,b for CY7C1462KV25/CY7C1462KVE25) inputs must be driven in each cycle of the burst write in order to write the correct bytes of data. Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the “sleep” mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW. On-Chip ECC CY7C1460KVE25/CY7C1462KVE25 SRAMs include an on-chip ECC algorithm that detects and corrects all single-bit memory errors, including Soft Error Upset (SEU) events induced by cosmic rays, alpha particles etc. The resulting Soft Error Rate (SER) of these devices is anticipated to be <0.01 FITs/Mb a 4-order-of-magnitude improvement over comparable SRAMs with no On-Chip ECC, which typically have an SER of 200 FITs/Mb or more. To protect the internal data, ECC parity bits (invisible to the user) are used. The ECC algorithm does not correct multi-bit errors.However,Cypress SRAMs are architected in such a way that a single SER event has a very low probability of causing a multi-bit error across any data word. The extreme rarity of multi-bit errors results in a SER of <0.01 FITs/Mb. |
Podobny numer części - CY7C1460KV25 |
|
Podobny opis - CY7C1460KV25 |
|
|
Link URL |
Polityka prywatności |
ALLDATASHEET.PL |
Czy Alldatasheet okazała się pomocna? [ DONATE ] |
O Alldatasheet | Reklama | Kontakt | Polityka prywatności | Linki | Lista producentów All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |