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GS74117AX-12I Arkusz danych(PDF) 5 Page - GSI Technology |
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GS74117AX-12I Arkusz danych(HTML) 5 Page - GSI Technology |
5 / 12 page Rev: 1.02 10/2002 5/12 © 2001, Giga Semiconductor, Inc. Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. GS74117AX AC Test Conditions DQ VT = 1.4 V 50 Ω 30pF1 DQ 3.3 V Output Load 1 Output Load 2 589 Ω 434 Ω 5pF1 Note: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted. 3. Output load 2 for tLZ, tHZ, tOLZ and tOHZ Parameter Conditions Input high level VIH = 2.4 V Input low level VIL = 0.4 V Input rise time tr = 1 V/ns Input fall time tf = 1 V/ns Input reference level 1.4 V Output reference level 1.4 V Output load Fig. 1& 2 |
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