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74ALVCH16825DGG Arkusz danych(PDF) 4 Page - NXP Semiconductors

Numer części 74ALVCH16825DGG
Szczegółowy opis  18-bit buffer/driver 3-State
Download  10 Pages
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Producent  PHILIPS [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74ALVCH16825DGG Arkusz danych(HTML) 4 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74ALVCH16825
18-bit buffer/driver (3-State)
1998 Jul 27
4
LOGIC DIAGRAM
nYn
TO 8 OTHER CHANNELS
nAn
nOE2
nOE1
SH00140
BUS HOLD CIRCUIT
To internal circuit
VCC
Data Input
SW00044
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
VCC
DC supply voltage 2.5V range (for max. speed
performance @ 30 pF output load)
2.3
2.7
V
VCC
DC supply voltage 3.3V range (for max. speed
performance @ 50 pF output load)
3.0
3.6
V
VI
DC Input voltage range
0
VCC
V
VO
DC output voltage range
0
VCC
V
Tamb
Operating free-air temperature range
–40
+85
°C
tr, tf
Input rise and fall times
VCC = 2.3 to 3.0V
VCC = 3.0 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +4.6
V
IIK
DC input diode current
VI t0
–50
mA
VI
DC input voltage
For control pins2
–0.5 to +4.6
V
VI
DC in ut voltage
For data inputs2
–0.5 to VCC +0.5
V
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VO
DC output voltage
Note 2
–0.5 to VCC +0.5
V
IO
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC
DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–65 to +150
°C
PTOT
Power dissipation per package
–plastic medium-shrink (SSOP)
–plastic thin-medium-shrink (TSSOP)
For temperature range: –40 to +125
°C
above +55
°C derate linearly with 11.3 mW/K
above +55
°C derate linearly with 8 mW/K
850
600
mW
NOTE:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.


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