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74LV10D Arkusz danych(PDF) 5 Page - NXP Semiconductors

Numer części 74LV10D
Szczegółowy opis  Triple 3-input NAND gate
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Producent  PHILIPS [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LV10D Arkusz danych(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74LV10
Triple 3-input NAND gate
1998 Apr 20
5
DC ELECTRICAL CHARACTERISTICS (Continued)
Over recommended operating conditions. Voltages are referenced to GND (ground = 0 V).
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
-40
°C to +85°C
-40
°C to +125°C
UNIT
MIN
TYP1
MAX
MIN
MAX
∆ICC
Additional
quiescent supply
current per input
VCC = 2.7 V to 3.6 V; VI = VCC – 0.6 V
500
850
µA
NOTE:
1. All typical values are measured at Tamb = 25°C.
AC CHARACTERISTICS
GND = 0V; tr = tf ≤ 2.5ns; CL = 50pF; RL = 1KΩ
CONDITION
LIMITS
SYMBOL
PARAMETER
WAVEFORM
CONDITION
–40 to +85
°C
–40 to +125
°C
UNIT
VCC(V)
MIN
TYP1
MAX
MIN
MAX
1.2
55
t
/
Propagation delay
Figure 1 2
2.0
19
36
44
ns
tPHL/PLH
gy
nA, nB, nC to nY
Figure 1, 2
2.7
14
26
33
ns
3.0 to 3.6
102
21
26
NOTES:
1. Unless otherwise stated, all typical values are measured at Tamb = 25°C.
2. Typical values are measured at VCC = 3.3 V.
AC WAVEFORMS
VM = 1.5 V at VCC ≥ 2.7 V;
VM = 0.5 × VCC at VCC < 2.7 V;
VOL and VOH are the typical output voltage drop that occur with the
output load.
SV00420
VM
nA, nB, nC
INPUT
nY OUTPUT
VM
t PLH
t PHL
GND
VI
VOL
VOH
Figure 1. Input (nA, nB, nC) to output (nY) propagation delays.
TEST CIRCUIT
PULSE
GENERATOR
RT
VI
D.U.T.
VO
CL
RL = 1k
VCC
Test Circuit for switching times
DEFINITIONS
VCC
VI
< 2.7V
VCC
TEST
tPLH/tPHL
RT = Termination resistance should be equal to ZOUT of pulse generators.
50pF
SV00901
RL = Load resistor
CL = Load capacitance includes jig and probe capacitance
2.7–3.6V
2.7V
Figure 2. Load circuitry for switching times.


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