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74LV11N Arkusz danych(PDF) 5 Page - NXP Semiconductors |
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74LV11N Arkusz danych(HTML) 5 Page - NXP Semiconductors |
5 / 10 page Philips Semiconductors Product specification 74LV11 Triple 3-input AND gate 1998 Apr 20 5 DC CHARACTERISTICS FOR THE LV FAMILY (Continued) Over recommended operating conditions. Voltages are referenced to GND (ground = 0V). SYMBOL PARAMETER TEST CONDITIONS LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS -40 °C to +85°C -40 °C to +125°C UNIT ICC Quiescent supply current; SSI VCC = 3.6V; VI = VCC or GND; IO = 0 20.0 40 µA ∆ICC Additional quiescent supply current per input VCC = 2.7V to 3.6V; VI = VCC – 0.6V 500 850 µA NOTE: 1. All typical values are measured at Tamb = 25°C. AC CHARACTERISTICS GND = 0V; tr = tf ≤ 2.5ns; CL = 50pF; RL = 1KΩ CONDITION LIMITS SYMBOL PARAMETER WAVEFORM CONDITION –40 to +85 °C –40 to +125 °C UNIT VCC(V) MIN TYP1 MAX MIN MAX 1.2 60 tPHL/PLH Propagation delay Figures 1 2 2.0 20 39 46 ns tPHL/PLH gy nA, nB, nC to nY Figures 1, 2 2.7 15 29 34 ns 3.0 to 3.6 112 23 27 NOTES: 1. Unless otherwise stated, all typical values are measured at Tamb = 25°C. 2. Typical values are measured at VCC = 3.3 V. AC WAVEFORMS VM = 1.5 V at VCC w 2.7 V VM = 0.5 × VCC at VCC < 2.7 V VOL and VOH are the typical output voltage drop that occur with the output load. SV00423 VM nA, nB, nC INPUT nY OUTPUT VM tPLH tPHL GND Vl VOL VOH Figure 1. Input (nA, nB, nC) to output (nY) propagation delays. TEST CIRCUIT PULSE GENERATOR RT VI D.U.T. VO CL RL = 1k VCC Test Circuit for switching times DEFINITIONS VCC VI < 2.7V VCC TEST tPLH/tPHL RT = Termination resistance should be equal to ZOUT of pulse generators. 50pF SV00901 RL = Load resistor CL = Load capacitance includes jig and probe capacitance 2.7–3.6V 2.7V Figure 2. Load circuitry for switching times. |
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