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74LV27DB Arkusz danych(PDF) 5 Page - NXP Semiconductors |
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74LV27DB Arkusz danych(HTML) 5 Page - NXP Semiconductors |
5 / 10 page Philips Semiconductors Product specification 74LV27 Triple 3-input NOR gate 1998 Apr 20 5 DC ELECTRICAL CHARACTERISTICS (Continued) Over recommended operating conditions. Voltages are referenced to GND (ground = 0V). LIMITS SYMBOL PARAMETER TEST CONDITIONS -40 °C to +85°C -40 °C to +125°C UNIT MIN TYP1 MAX MIN MAX ICC Quiescent supply current; SSI VCC = 5.5V; VI = VCC or GND; IO = 0 20.0 40 µA ∆ICC Additional quiescent supply current VCC = 2.7V to 3.6V; VI = VCC – 0.6V 500 850 µA NOTE: 1. All typical values are measured at Tamb = 25°C. AC CHARACTERISTICS GND = 0V; tr = tf ≤ 2.5ns; CL = 50pF; RL = 1KΩ CONDITION LIMITS SYMBOL PARAMETER WAVEFORM CONDITION –40 to +85 °C –40 to +125 °C UNIT VCC(V) MIN TYP1 MAX MIN MAX 1.2 50 Propagation delay 2.0 17 22 27 tPHL/PLH Propagation delay nA, nB, nC to nY Figures 1, 2 2.7 13 16 20 ns nA, nB, nC to nY 3.0 to 3.6 102 13 16 4.5 to 5.5 11 14 NOTES: 1. Unless otherwise stated, all typical values are measured at Tamb = 25°C 2. Typical values are measured at VCC = 3.3 V. AC WAVEFORMS VM = 1.5 V at VCC ≥ 2.7 V and ≤ 3.6 V; VM = 0.5 × VCC at VCC < 2.7 V and ≥ 4.5 V; VOL and VOH are the typical output voltage drop that occur with the output load. SV00420 VM nA, nB, nC INPUT nY OUTPUT VM t PLH t PHL GND VI VOL VOH Figure 1. Input (nA, nB, nC) to output (nY) propagation delays. TEST CIRCUIT PULSE GENERATOR RT Vl D.U.T. VO CL RL= 1k Vcc Test Circuit for Outputs DEFINITIONS VCC VI < 2.7V 2.7–3.6V VCC 2.7V TEST tPLH/tPHL ≥ 4.5 V VCC RL = Load resistor CL = Load capacitance includes jig and probe capacitiance 50pF RT = Termination resistance should be equal to ZOUT of pulse generators. SV00902 Figure 2. Load circuitry for switching times. |
Podobny numer części - 74LV27DB |
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Podobny opis - 74LV27DB |
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