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74LV4052PW Arkusz danych(PDF) 7 Page - NXP Semiconductors

Numer części 74LV4052PW
Szczegółowy opis  Dual 4-channel analog multiplexer/demultiplexer
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Producent  PHILIPS [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LV4052PW Arkusz danych(HTML) 7 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74LV4052
Dual 4-channel analog multiplexer/demultiplexer
1998 Jun 23
7
DC ELECTRICAL CHARACTERISTICS (
Continued)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
-40
°C to +85°C
-40
°C to +125°C
UNIT
MIN
TYP1
MAX
MIN
MAX
VCC = 1.2 V
VI = VIH or VIL;
IS = 100 mA;
VIS = VCC
250
W
R
ON-resistance
VCC = 2.0 V
120
320
370
RON
ON resistance
(rail)
VCC = 2.7 V
VI = VIH or VIL;
75
195
225
()
VCC = 3.0 to 3.6 V
I
IH
IL
IS = 1000 mA;
V
V
70
175
205
W
VCC = 4.5 V
VIS = VCC
50
130
150
VCC = 6.0 V
45
120
135
VCC = 1.2 V
Maximum variation
VCC = 2.0 V
5
DRON
Maximum variation
of ON-resistance
b
VCC = 2.7 V
VI = VIH or VIL;
4
W
DRON
between any two
channels
VCC = 3.0 to 3.6 V
I
IH
IL
VIS = VCC to GND
4
W
channels
VCC = 4.5 V
3
VCC = 6.0 V
2
NOTES:
1. All typical values are measured at Tamb = 25°C.
2. At supply voltages approaching 1.2 V, the analog switch ON-resistance becomes extremely non-linear. Therefore, it is recommended that
these devices be used to transmit digital signals only, when using these supply voltages.
3. RON (MAX) data is preliminary.
SV01688
V
HIGH
(from select inputs)
I
is
nZ
VEE
nYn
V
is
= 0 to V
CC
– VEE
Figure 1. Test circuit for measuring ON-resistance (RON).
SV01660
A
LOW
(from select inputs)
nZ
nYn
VI = VCC or VEE
VO = VEE or VCC
A
VEE
Figure 2. Test circuit for measuring OFF-state current.
SV01661
HIGH
(from select inputs)
nZ
nYn
VI = VCC or VEE
VO
(open circuit)
A
VEE
Figure 3. Test circuit for measuring ON-state current.
SV01701
0
V
CC
= 2.0 V
V
CC
= 3.0 V
V
CC
= 4.5 V
0
1.2
2.4
3.6
V
is
(V)
4.8
60
30
120
90
150
RON
(
W)
Figure 4. Typical ON-resistance (Ron) as a function of input
voltage (Vis) for Vis = 0 to VCC – VEE.


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