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MC10E112FNG Arkusz danych(PDF) 5 Page - ON Semiconductor

Numer części MC10E112FNG
Szczegółowy opis  5V ECL Quad Driver
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MC10E112, MC100E112
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Table 8. AC CHARACTERISTICS VCCx= 5.0 V; VEE= 0.0 V or VCCx= 0.0 V; VEE= −5.0 V (Note 9)
0°C
25°C
85°C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
fMAX
Maximum Toggle Frequency
700
700
700
MHZ
tPLH
Propagation Delay to Output
ps
tPHL
D, EN
350
550
750
350
550
750
350
550
750
tSKEW
Within-Device Skew
ps
Dn to Qn, Qn (Note 10)
80
80
80
Qna to Qnb (Note 11)
40
40
40
tJITTER
Random Clock Jitter (RMS)
< 1
< 1
< 1
ps
tr
Rise/Fall Times
ps
tf
(20 - 80%)
275
425
700
275
425
700
275
425
700
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
10.Within-device skew is defined as identical transitions on similar paths through a device.
11. Skew defined between common OR or common NOR outputs of a single gate.
Figure 3. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
Driver
Device
Receiver
Device
QD
Q
D
Zo = 50 W
Zo = 50 W
50 W
50 W
VTT
VTT = VCC − 2.0 V


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