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SN74ABT8245 Arkusz danych(PDF) 1 Page - Texas Instruments |
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SN74ABT8245 Arkusz danych(HTML) 1 Page - Texas Instruments |
1 / 30 page SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode D SCOPE ™ Instruction Set: – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ – Parallel-Signature Analysis at Inputs With Masking Option – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Even-Parity Opcodes D Two Boundary-Scan Cells per I/O for Greater Flexibility D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design Significantly Reduces Power Dissipation D Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers(FK), and Standard Ceramic DIPs (JT) description The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instru- ments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE ™ octal bus transceivers. Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The output-enable (OE) input can be used to disable the device so that the buses are effectively isolated. Copyright © 1996, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. SCOPE and EPIC- ΙΙB are trademarks of Texas Instruments Incorporated. 32 1 13 14 5 6 7 8 9 10 11 A8 TDI TCK NC TMS TDO B8 A2 A1 OE NC DIR B1 B2 4 15 16 17 18 28 27 26 25 24 23 22 21 20 19 12 SN54ABT8245 . . . JT PACKAGE SN74ABT8245 . . . DW PACKAGE (TOP VIEW) SN54ABT8245 . . . FK PACKAGE (TOP VIEW) 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 DIR B1 B2 B3 B4 GND B5 B6 B7 B8 TDO TMS OE A1 A2 A3 A4 A5 VCC A6 A7 A8 TDI TCK NC – No internal connection Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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