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LCP3121 Arkusz danych(PDF) 4 Page - STMicroelectronics |
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LCP3121 Arkusz danych(HTML) 4 Page - STMicroelectronics |
4 / 6 page LCP3121 4/6 FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST 0.01 0.10 1 10 100 1000 0 2 4 6 8 10 12 14 16 18 20 ITSM (A) t(s) F=50Hz Tj initial = 25°c Fig. 1: Maximum non repetitive surge peak-on-state current versus overload duration. -40 -20 0 20 40 60 80 100 120 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 Tj(°C) IH [Tj] / IH [Tj=25°C] Fig. 2: Relative variation of holding current versus junction temperature (typical values). This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : IPP = 10A, 10/1000 µs. - The D.U.T. will come back to the off-state within a duration of 50ms max. R Surge generator V = -48 V BAT -VP -VP D.U.T |
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