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SN74ABTH18504A Arkusz danych(PDF) 3 Page - Texas Instruments |
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SN74ABTH18504A Arkusz danych(HTML) 3 Page - Texas Instruments |
3 / 39 page SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful. Active bus-hold circuitry holds unused or floating data inputs at a valid logic level. The B-port outputs of ’ABTH182504A, which are designed to source or sink up to 12 mA, include 25- Ω series resistors to reduce overshoot and undershoot. The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for operation from –40 °C to 85°C. FUNCTION TABLE† (normal mode, each register) INPUTS OUTPUT OEAB LEAB CLKENAB CLKAB A B L L L L X B0‡ L LL ↑ LL L LL ↑ HH L LH X X B0‡ L HX X L L L HX X H H H X X X X Z † A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA, LEBA, CLKENBA, and CLKBA. ‡ Output level before the indicated steady-state input conditions were established |
Podobny numer części - SN74ABTH18504A |
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Podobny opis - SN74ABTH18504A |
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