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ADM1186-1ARQZ-REEL Arkusz danych(PDF) 5 Page - Analog Devices |
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ADM1186-1ARQZ-REEL Arkusz danych(HTML) 5 Page - Analog Devices |
5 / 28 page ADM1186 Rev. 0 | Page 5 of 28 Parameter Min Typ Max Unit Test Conditions/Comments SEQ_DONE PIN Output Low Voltage, VSEQ_DONEL 0.4 V VVCC = 2.7 V, ISINK = 2 mA Leakage Current 1 μA SEQ_DONE = 5.5 V VVCC That Guarantees Valid Outputs 1 V Output is guaranteed to be either low (VSEQ_DONEL = 0.4 V) or giving a valid output level from VVCC = 1 V, ISINK = 30 μA or VVCC = 1.1 V, ISINK = 100 μA RESPONSE TIMING Includes input glitch filter and all other internal delays VINx to PWRGD VINx Going Low to High 21.9 28.8 35.2 μs 50 mV input overdrive VINx Going High to Low 5.8 7.3 8.9 μs 50 mV input overdrive VINx to FAULT, OUTx Low VINx Going High to Low (UV Fault) 6.1 7.5 9.2 μs 50 mV input overdrive UP, DOWN, and UP/DOWN to FAULT, OUTx Low, tUDOUT 5.5 8.6 12.1 μs 100 mV input overdrive 5.8 7.7 10.5 μs 1 V input overdrive External FAULT to OUTx Low 10 μs 1 V input overdrive Fault Hold Time 35 44 54 μs UP, UP/DOWN held low 1 Input comparators do not include hysteresis on their inputs. The comparator output passes through a digital glitch filter to remove short transients from the input signal that would otherwise drive the state machine. |
Podobny numer części - ADM1186-1ARQZ-REEL |
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Podobny opis - ADM1186-1ARQZ-REEL |
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