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MCZ33975AEKR2 Arkusz danych(PDF) 9 Page - Freescale Semiconductor, Inc |
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MCZ33975AEKR2 Arkusz danych(HTML) 9 Page - Freescale Semiconductor, Inc |
9 / 34 page Analog Integrated Circuit Device Data Freescale Semiconductor 9 33975 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS DIGITAL INTERFACE Input Logic High-Voltage Thresholds(11) VIH 0.7 x VDD –VDD + 0.3 V Input Logic Low-Voltage Thresholds(11) VIL GND - 0.3 – 0.2 x VDD V SCLK, SI, Tri-State SO Input Current 0.0 V to VDD ISCLK, ISI, ISO(TRI) -10 – 10 μA CS Input Current CS = VDD ICS -10 – 10 μA CS Pull-Up Current CS = 0.0V ICS 30 – 100 μA SO High-State Output Voltage ISO(HIGH) = -200μA VSO(HIGH) VDD - 0.8 – VDD V SO Low-State Output Voltage ISO(HIGH) = 1.6mA VSO(LOW) – – 0.4 V Input Capacitance on SCLK, SI, Tri-State SO(12) CIN – – 20 pF INT Internal Pull-Up Current – 15 40 100 μA INT Voltage INT = Open Circuit VINT(HIGH) VDD - 0.5 – VDD V INT Voltage IINT = 1.0mA VINT(LOW) – 0.2 0.4 V WAKE Internal Pull-Up Current IWAKE(PU) 20 40 100 μA WAKE Voltage WAKE = Open Circuit VWAKE(HIGH) 4.0 4.3 5.3 V WAKE Voltage IWAKE = 1.0mA VWAKE(LOW) – 0.2 0.4 V WAKE Voltage(12) Maximum Voltage Applied to WAKE Through External Pull-Up VWAKE(MAX) – – 40 V Notes 11. Upper and lower logic threshold voltage levels apply to SI, CS, and SCLK. 12. This parameter is guaranteed by design however, is not production tested. Table 4. Static Electrical Characteristics (continued) Characteristics noted under conditions of 3.0V ≤ VDD ≤ 5.5V, 8.0V ≤ VPWR ≤ 28V, -40°C ≤ TC ≤ 125°C, unless otherwise noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR = 13V, TA = 25°C. Characteristic Symbol Min Typ Max Unit |
Podobny numer części - MCZ33975AEKR2 |
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Podobny opis - MCZ33975AEKR2 |
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