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TLPXXM Arkusz danych(PDF) 5 Page - STMicroelectronics |
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TLPXXM Arkusz danych(HTML) 5 Page - STMicroelectronics |
5 / 14 page FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT: GO-NO GO TEST R -VP V BAT -48 V = Surge generator D.U.T. This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : IPP = 10A, 10/1000 µs. - The D.U.T. will come back to the off-state within a duration of 50ms max. ORDER CODE Package Types Marking PowerSO-10 TLP140M TLP200M TLP270M TLP140M TLP200M TLP270M D 2PAK TLP140G TLP200G TLP270G TLP140G TLP200G TLP270G I 2PAK TLP140G-1 TLP200G-1 TLP270G-1 TLP140G TLP200G TLP270G MARKING TPL 270 M - TR Breakdown Voltage Packaging: -TR= tapeandreelonlyfor”M”version(600pcs) = tube (50 pcs) Tripolar Line Protection Package: M : Power SO10 G:D 2PAK G-1 : I 2PAK TLPxxM/G/G-1 5/14 |
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