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TD62304AP Arkusz danych(PDF) 4 Page - Toshiba Semiconductor |
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TD62304AP Arkusz danych(HTML) 4 Page - Toshiba Semiconductor |
4 / 9 page TD62304,305P/AP/F/AF 2001-07-16 4 TEST CIRCUIT 1. ICEX 2. hFE, VCE (sat) 3. IIN (ON) 4. IIN (OFF) 5. VIN (ON) 6. ICC 7. tON, tOFF Note 1: Pulse Width 50 µs, duty cycle 10% Output impedance 50 Ω, tr ≤ 10 ns, tf ≤ 5 ns Note 2: CL includes probe and jig capacitance. PRECAUTIONS for USING This IC does not include built-in protection circuits for excess current or overvoltage. If this IC is subjected to excess current or overvoltage, it may be destroyed. Hence, the utmost care must be taken when systems which incorporate this IC are designed.Utmost care is necessary in the design of the output line, VCC and GND line since IC may be destroyed due to short−circuit between outputs, air contamination fault, or fault by improper grounding. |
Podobny numer części - TD62304AP |
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Podobny opis - TD62304AP |
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