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Z0103MN0,135 Arkusz danych(PDF) 9 Page - NXP Semiconductors |
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Z0103MN0,135 Arkusz danych(HTML) 9 Page - NXP Semiconductors |
9 / 15 page Z0103MN0 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 01 — 3 January 2011 9 of 15 NXP Semiconductors Z0103MN0 4Q Triac Fig 13. Normalized critical rate of rise of off-state voltage as a function of junction temperature; typical values Fig 14. Normalized holding current as a function of junction temperature 1.6 1.2 0.8 0.4 0 A 0 50 100 150 Tj (°C) 003aaa208 Tj (°C) −50 150 100 0 50 003aaa204 1 2 3 0 IH(25°C) IH |
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