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LC374100ST Arkusz danych(PDF) 4 Page - Sanyo Semicon Device

Numer części LC374100ST
Szczegółowy opis  4 MEG (524288 words x 8 bits) Mask ROM Internal Clocked Silicon Gate
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Producent  SANYO [Sanyo Semicon Device]
Strona internetowa  https://www.sanyo-av.com/us/
Logo SANYO - Sanyo Semicon Device

LC374100ST Arkusz danych(HTML) 4 Page - Sanyo Semicon Device

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PS No. 5609-4/4
LC374100SM, ST
Timing Chart
This catalog provides information as of May, 1998. Specifications and information herein are subject to change
without notice.
s No products described or contained herein are intended for use in surgical implants, life-support systems, aerospace
equipment, nuclear power control systems, vehicles, disaster/crime-prevention equipment and the like, the failure of
which may directly or indirectly cause injury, death or property loss.
s Anyone purchasing any products described or contained herein for an above-mentioned use shall:
ΠAccept full responsibility and indemnify and defend SANYO ELECTRIC CO., LTD., its affiliates, subsidiaries and
distributors and all their officers and employees, jointly and severally, against any and all claims and litigation and all
damages, cost and expenses associated with such use:
 Not impose any responsibility for any fault or negligence which may be cited in any such claim or litigation on
SANYO ELECTRIC CO., LTD., its affiliates, subsidiaries and distributors or any of their officers and employees
jointly or severally.
s Information (including circuit diagrams and circuit parameters) herein is for example only; it is not guaranteed for
volume production. SANYO believes information herein is accurate and reliable, but no guarantees are made or implied
regarding its use or any infringements of intellectual property rights or other rights of third parties.
System Design Notes
These ICs adopt the ATD technique, in which operation starts when a change in either the CE or address inputs is
detected. This means that the output data immediately after power is applied is invalid. When using these ICs as program
memory for Z80 and similar microprocessors, applications must take into account the fact that valid data will not be
output after power is first applied unless the value of either the CE or at least one of the address lines is changed after the
power supply has stabilized.
Another point due to the use of the ATD technique is that these ICs are sensitive to input noise. Do not apply voltages
outside the allowable DC input levels for extended periods and do not apply input voltages with large noise components.
AC Test Conditions
Input pulse levels
0.4 to 2.8 V
Input rise/fall time
5 ns
Input timing level
1.5 V
Output timing level
1.5 V
Output load
See Figure 1
Figure 1 Output Load


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