4

Test and applications board

This chapter includes information about the test and applications board including the test circuit, board layout, and parts list.

Figure 3.

Test circuit

JP1, JP2 :

Open = SE

Closed = BTL

JP3, JP4 :

Open = SE

Closed = BTL

4 IN1

5 IN2

12 IN3

11 IN4

6 SVR

14

OUT4

15

OUT3

2

OUT2

1

OUT1

IC1

STA540SAN

CLIPWATT15

C5

1000 µF

50 V

C6

100 nF

25 V

R1

10K

R2

1K8

C7 2200 µF, 25 V

C9 2200 µF, 25 V

C10 2200 µF, 25 V

C8 2200 µF, 25 V

JP1

JUMPER2X1(DIP)

JP2

JUMPER2X1(DIP)

JP3

JUMPER2X1(DIP)

JP4

JUMPER2X1(DIP)

C1

0.22uF

C2 0.22uF

C3 0.22uF

C4

0.22uF

JP6

JUMPER2X1(DIP)

JP5

JUMPER2X1(DIP)

C11

47 µF

25 V

C12

10 µF

25 V

1

3

2

SW1

SLIDSWITCH-2.54-3P

TP

TP1

1

2

3

4

5

6

CN1

RCA4CH_6P

C13

100 nF

ZD1

DO7

1

2

CN7

CN-5-02P

1

2

CN3

CN-5-02P

1

2

CN4

CN-5-02P

1

2

CN5

CN-5-02P

1

2

CN6

CN-5-02P

VCC

PGND

SGND

SGND

SGND

SGND

SGND

VCC

VCC

PGND

PGND

PGND

PGND

PGND

PGND

Diagnostics

IN1

IN2

IN3

IN4

SGND

SGND