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ES-LPC185X Arkusz danych(PDF) 8 Page - NXP Semiconductors

Numer części ES-LPC185X
Szczegółowy opis  Errata sheet LPC185x, LPC183x, LPC182x, LPC181x flash-based devices
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Producent  NXP [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo NXP - NXP Semiconductors

ES-LPC185X Arkusz danych(HTML) 8 Page - NXP Semiconductors

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ES_LPC185X_3X_2X_1X_FLASH
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved.
Errata sheet
Rev. 2.1 — 23 November 2012
8 of 11
NXP Semiconductors
ES_LPC185x/3x/2x/1x Flash
Errata sheet LPC185x/3x/2x/1x flash-based devices
4.
AC/DC deviations detail
4.1 IBAT.1: VBAT supply current higher than expected
Introduction:
The LPC185x flash-based devices contain a Real-Time Clock which measures the
passage of time. The RTC has an ultra-low power design to support battery powered
systems with a dedicated battery supply pin.
Problem:
On the LPC185x flash-based devices, high current consumption of about 70 uA or higher
may occur on the VBAT power supply pin due to current drain from the RTC_ALARM and
SAMPLE pins.
On the LPC185x flash-based devices, at temperatures lower than 0
C, high current
consumption up to 25 uA may occur on the VBAT power supply pin while VDD is present
if VDD < VBAT. This is seen during Deep Sleep, Power Down, and Deep Power Down
modes.
Work-around:
VBAT current consumption due to RTC_ALARM and SAMPLE pins can be lowered
significantly by configuring the RTC_ALARM pin and SAMPLE pins as "Inactive" by
setting the ALARMCTRL 7:6 field in CREG0 to 0x3 and the SAMPLECTRL 13:12 field in
CREG0 to 0x3. These bits persist through power cycles and reset, as long as VBAT is
present.
To work-around the current consumption at temperatures less than 0
C, keep the VBAT
voltage less than VDD. For example, use a 3.0 V VBAT voltage with a 3.3 V VDD supply.
This also avoids current consumption during active mode which can occur when VBAT >
VDD (see datasheet for details).
4.2 IRC.1: IRC frequency variation higher than expected
Introduction:
The IRC is used as the clock source for the WWDT and/or as the clock that drives the
PLLs and the CPU. The nominal IRC frequency is 12 MHz. The IRC is trimmed to 1 %
accuracy over the entire voltage and temperature range.
Problem:
On LPC185x flash-based devices, the IRC currently has a non-linear behavior at high
temperatures. This results in worse IRC accuracy than specified in the Data Sheet.
Work-around:
Many of the peripherals on these devices require use of an external crystal to meet timing
accuracy even at the specified accuracy. The IRC is typically used during boot up and
during UART and CAN In-Application Programming. It is recommended to avoid use of
UART and CAN IAP at elevated temperatures to ensure accuracy.


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