AD1315

–7–

REV. A

APPLICATIONS

The AD1315 has been optimized to function as an active load

in an ATE test system. Figure 14 shows a block diagram illus-

trating the electronics behind a single pin of a high speed digital

functional test system with the ability to test I/O pins on logic

devices. The AD1315 active load, AD1321 or AD1324 pin

driver, AD1317 high speed dual comparator and the AD664

quad 12-bit voltage DAC would comprise the pin electronic

portion of the test system. Such a system could operate at

100 MHz with the AD1321 (200 MHz with the AD1324) in a

data mode or 50 MHz (100 MHz) in the I/O mode.

must be able to sink or source 50 mA, therefore a standard op

amp will not suffice. An op amp with an external complemen-

tary output stage or a high power op amp such as the AD842

will work well here. A typical application is shown in Figure 15.

LAYOUT CONSIDERATIONS

–2 V and +7 V. These return points must be able to source or

diverted here in the inhibit mode. The RTNs may be connected

to a suitable GND. However, to keep transient ground currents

voltage point.

Figure 14. High Speed Digital Test System Block Diagram