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AD9070 Arkusz danych(PDF) 4 Page - Analog Devices |
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AD9070 Arkusz danych(HTML) 4 Page - Analog Devices |
4 / 16 page AD9070 –4– REV. B CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD9070 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. Table I. Output Coding Twos Step AIN– AIN Code Complement OR 1024 ≥ 0.512 V >511 01 1111 1111 1 1023 0.511 V 511 01 1111 1111 0 1022 0.510 V 510 01 1111 1110 0 •• • • • •• • • • •• • • • 513 0.001 V 1 00 0000 0001 0 512 0.000 V 0 00 0000 0000 0 511 –0.001 V –1 11 1111 1111 0 •• • • • •• • • • •• • • • 1 –0.511 V –511 10 0000 0001 0 0 –0.512 V –512 10 0000 0000 0 –1 ≤ –0.513 V <512 10 0000 0000 1 ORDERING GUIDE Model Temperature Range Package Option* AD9070BR –40 °C to +85°C R-28 AD9070/PCB +25 °C Evaluation Board 5962-9756301HXC –55 °C to +125°C DH-28 *DH = Ceramic DIP; R = Small Outline IC (SOIC). ABSOLUTE MAXIMUM RATINGS* VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –6 V Analog Inputs . . . . . . . . . . . . . . . . . . . . . VEE –1 V to +1.0 V Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . VEE to 0.0 V VREF IN, VREF OUT . . . . . . . . . . . . . . . . . . . . VEE to 0.0 V Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . 20 mA Operating Temperature . . . . . . . . . . . . . . . . –55 °C to +125°C Storage Temperature . . . . . . . . . . . . . . . . . . –65 °C to +150°C Maximum Junction Temperature . . . . . . . . . . . . . . . +175 °C Maximum Case Temperature . . . . . . . . . . . . . . . . . . +150 °C *Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions outside of those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability. EXPLANATION OF TEST LEVELS Test Level I – 100% production tested. II – 100% production tested at +25 °C and sample tested at specified temperatures. III – Sample tested only. IV – Parameter is guaranteed by design and characterization testing. V – Parameter is a typical value only. VI – 100% production tested at +25 °C; guaranteed by design and characterization testing for industrial temperature range; 100% production tested at temperature extremes for military devices. WARNING! ESD SENSITIVE DEVICE |
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