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FQD9N08 Arkusz danych(PDF) 5 Page - Fairchild Semiconductor |
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FQD9N08 Arkusz danych(HTML) 5 Page - Fairchild Semiconductor |
5 / 9 page Rev. A2, December 2000 ©2000 Fairchild Semiconductor International Charge V GS 5V Qg Q gs Q gd 3mA V GS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT Charge V GS 5V Qg Q gs Q gd 3mA V GS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT VGS V DS 10% 90% t d(on) t r t on t off t d(off) t f VDD 5V V DS RL DUT R G VGS VGS V DS 10% 90% t d(on) t r t on t off t d(off) t f VDD 5V V DS RL DUT R G VGS E AS =L IAS 2 ---- 2 1 -------------------- BVDSS -VDD BVDSS V DD V DS BVDSS t p VDD IAS VDS (t) I D (t) Time 10V DUT R G L I D t p E AS =L IAS 2 ---- 2 1 E AS =L IAS 2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS V DD V DS BVDSS t p VDD IAS VDS (t) I D (t) Time 10V DUT R G L L I D I D t p Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms |
Podobny numer części - FQD9N08 |
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Podobny opis - FQD9N08 |
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