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CD4511BPWE4 Arkusz danych(PDF) 1 Page - Texas Instruments |
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CD4511BPWE4 Arkusz danych(HTML) 1 Page - Texas Instruments |
1 / 15 page Data sheet acquired from Harris Semiconductor SCHS072B – Revised July 2003 Lamp Test (LT), Blanking (BL), and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used. The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes). These devices are similar to the type MC14511. Copyright 2003, Texas Instruments Incorporated |
Podobny numer części - CD4511BPWE4 |
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Podobny opis - CD4511BPWE4 |
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