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FSTUD32450GX Arkusz danych(PDF) 11 Page - Fairchild Semiconductor |
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FSTUD32450GX Arkusz danych(HTML) 11 Page - Fairchild Semiconductor |
11 / 13 page 11 www.fairchildsemi.com Undershoot Characteristic (Note 12) Note 12: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage undershoot event. FIGURE 1. Device Test Conditions Transient Input Voltage (VIN) Waveform AC Loading and Waveforms Note: Input driven by 50 : source terminated in 50: Note: CL includes load and stray capacitance Note: Input Frequency 1.0 MHz, tW 500 ns FIGURE 2. AC Test Circuit FIGURE 3. AC Waveforms Symbol Parameter Min Typ Max Units Conditions VOUTU Output Voltage During Undershoot 2.5 VOH 0.3 V S2 S5 0V, Figure 1 TBD TBD V S2 S5 VCC Parameter Value Units VIN see Waveform V R1 R2 100K : VTRI 11.0 V VCC 5.5 V |
Podobny numer części - FSTUD32450GX |
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Podobny opis - FSTUD32450GX |
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