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TLP708 Arkusz danych(PDF) 4 Page - Toshiba Semiconductor

Numer części TLP708
Szczegółowy opis  Factory Automation (FA) Home Electrical Appliances Operates at high ambient temperatures up to 125
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Producent  TOSHIBA [Toshiba Semiconductor]
Strona internetowa  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TLP708 Arkusz danych(HTML) 4 Page - Toshiba Semiconductor

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TLP708,TLP708F
2012-08-07
4
Switching Characteristics
(Unless otherwise specified, Ta = -40 to 125°C, VCC = 4.5 to 5.5 V)
Characteristic
Symbol
Test
Circuit
Test Conditions
Min.
Typ.*
Max.
Unit
Propagation delay time to logic low
output
tpHL
IF=0→7.5mA
35
75
ns
Propagation delay time to logic high
output
tpLH
IF=7.5→0mA
RL=350Ω
CL=15pF
(Note 4)
35
75
ns
Switching time dispersion between
ON and OFF
|tpHL-
tpLH|
12
35
ns
Propagation delay skew (Note 5)
tpsk
IF=0↔7.5mA
RL=350Ω
CL=15pF
(Note 4)
-50
50
ns
Output fall time(90-10%)
tf
IF=0→7.5mA
6
ns
Output rise time(10-90%)
tr
5
IF=7.5→0mA
RL =350Ω
CL=15pF
(Note 4)
18
ns
Common mode transient immunity
at high level output
CMH
VCM=1000Vp-p , IF=0mA,
VCC=5V , Ta=25℃
+
15
kV/μs
Common mode transient immunity
at low level output
CML
6
VCM=1000Vp-p , IF=10mA,
VCC=5V , Ta=25℃
-
15
kV/μs
*All typical values are at Ta=25
Note 3 : A ceramic capacitor (0.1
μF) should be connected from pin 6 (VCC) to pin 4 (GND) to stabilize the operation of the high gain
linear amplifier. Failure to provide the bypass may impair the switching property. The total lead length between the capacitor
and coupler should not exceed 1 cm.
Note 4 : f=5MHz, duty=50%, input current tr=tf=4.5ns,
CL is approximately 15pF which includes probe and jig/stray wiring capacitance.
Note 5: Propagation delay skew is defined as the difference between the largest and smallest propagation delay times (i.e. tpHL or
tpLH) of multiple samples. Evaluations of these samples are conducted under identical test conditions (supply voltage, input
current, temperature, etc).
TEST CIRCUIT 1: IOH Test Circuit
TEST CIRCUIT 2: VOL Test Circuit
TEST CIRCUIT 3: ICCL Test Circuit
TEST CIRCUIT 4: ICCH Test Circuit
A
VCC
0.1 μF
ICCH
SHIELD
1
2
3
6
5
4
IF
A
VCC
0.1 μF
ICCL
SHIELD
1
2
3
6
5
4
0.1μF
VOL
VCC
V
IO
IF
SHIELD
1
2
3
6
5
4
0.1μF
SHIELD
VF
VCC
IOH
A
VO
1
2
3
6
5
4


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