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AD7243ANZ Arkusz danych(PDF) 10 Page - List of Unclassifed Manufacturers

Numer części AD7243ANZ
Szczegółowy opis  STANDARD MICROCIRCUIT DRAWING
Download  12 Pages
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Producent  ETC2 [List of Unclassifed Manufacturers]
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AD7243ANZ Arkusz danych(HTML) 10 Page - List of Unclassifed Manufacturers

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STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93204
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
10
DSCC FORM 2234
APR 97
4.4.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 5, 6, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
c.
Subgroup 4 shall be measured only for initial qualification and after any process or design changes which may affect
the parameter. Sample size is 15 devices with no failures, and all inputs tested.
TABLE II. Electrical test requirements.
Test requirements
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
1, 7
1, 7
1, 7
Final electrical
parameters (see 4.2)
1, 2, 3, 4, 7, 8, 9
1/
1, 2, 3, 4, 7, 8, 9 1/
1, 2, 3, 4, 7, 8, 9 1/
Group A test
requirements (see 4.4)
1, 2, 3, 4, 7, 8, 9
1, 2, 3, 4, 7, 8, 9
1, 2, 3, 4, 7, 8, 9
Group C end-point electrical
parameters (see 4.4)
1
1
1, 2, 3, 4, 7, 8, 9
Group D end-point electrical
parameters (see 4.4)
1
1
1
Group E end-point electrical
parameters (see 4.4)
1
1
1
1/ PDA applies to subgroup 1.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
TA = +125°C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.


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