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AD7243SQ Arkusz danych(PDF) 10 Page - List of Unclassifed Manufacturers |
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AD7243SQ Arkusz danych(HTML) 10 Page - List of Unclassifed Manufacturers |
10 / 12 page STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 shall be measured only for initial qualification and after any process or design changes which may affect the parameter. Sample size is 15 devices with no failures, and all inputs tested. TABLE II. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Subgroups (in accordance with MIL-PRF-38535, table III) Device class M Device class Q Device class V Interim electrical parameters (see 4.2) 1, 7 1, 7 1, 7 Final electrical parameters (see 4.2) 1, 2, 3, 4, 7, 8, 9 1/ 1, 2, 3, 4, 7, 8, 9 1/ 1, 2, 3, 4, 7, 8, 9 1/ Group A test requirements (see 4.4) 1, 2, 3, 4, 7, 8, 9 1, 2, 3, 4, 7, 8, 9 1, 2, 3, 4, 7, 8, 9 Group C end-point electrical parameters (see 4.4) 1 1 1, 2, 3, 4, 7, 8, 9 Group D end-point electrical parameters (see 4.4) 1 1 1 Group E end-point electrical parameters (see 4.4) 1 1 1 1/ PDA applies to subgroup 1. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD- 883. |
Podobny numer części - AD7243SQ |
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Podobny opis - AD7243SQ |
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