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STP16CPC26 Arkusz danych(PDF) 11 Page - STMicroelectronics |
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STP16CPC26 Arkusz danych(HTML) 11 Page - STMicroelectronics |
11 / 26 page STP16CPC26 Typical test circuits Doc ID 18469 Rev 4 11/26 7 Typical test circuits Figure 9 and Figure 10 show respectively the typical test circuit used measuring electrical (e.g. input voltage high/low level, output leakage current, supply current, etc.) and switching characteristics (propagation delays, set-up and hold time, rise and fall time of V OUT , etc.). The resistor R L and capacitor C L in parallel connected to each output in Figure 9 simulate a LED behavior. Figure 9. Typical test circuit for electrical characteristics Figure 10. Typical test circuit for switching characteristics |
Podobny numer części - STP16CPC26 |
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Podobny opis - STP16CPC26 |
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