Zakładka z wyszukiwarką danych komponentów
  Polish  ▼
ALLDATASHEET.PL

X  

LF2246 Arkusz danych(PDF) 5 Page - LOGIC Devices Incorporated

Numer części LF2246
Szczegółowy opis  11 x 10-bit Image Filter
Download  7 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Producent  LODEV [LOGIC Devices Incorporated]
Strona internetowa  http://www.logicdevices.com
Logo LODEV - LOGIC Devices Incorporated

LF2246 Arkusz danych(HTML) 5 Page - LOGIC Devices Incorporated

  LF2246 Datasheet HTML 1Page - LOGIC Devices Incorporated LF2246 Datasheet HTML 2Page - LOGIC Devices Incorporated LF2246 Datasheet HTML 3Page - LOGIC Devices Incorporated LF2246 Datasheet HTML 4Page - LOGIC Devices Incorporated LF2246 Datasheet HTML 5Page - LOGIC Devices Incorporated LF2246 Datasheet HTML 6Page - LOGIC Devices Incorporated LF2246 Datasheet HTML 7Page - LOGIC Devices Incorporated  
Zoom Inzoom in Zoom Outzoom out
 5 / 7 page
background image
DEVICES INCORPORATED
LF2246
11 x 10-bit Image Filter
Video Imaging Products
08/16/2000–LDS.2246-K
2-15
1. Maximum Ratings indicate stress
specifications only. Functional oper-
ation of these products at values beyond
those indicated in the Operating Condi-
tions table is not implied. Exposure to
maximum rating conditions for ex-
tended periods may affect reliability.
2. The products described by this spec-
ification include internal circuitry de-
signed to protect the chip from damag-
ing substrate injection currents and ac-
cumulations of static charge. Neverthe-
less, conventional precautions should
be observed during storage, handling,
and use of these circuits in order to
avoid exposure to excessive electrical
stress values.
3. Thisdeviceprovideshardclampingof
transient undershoot and overshoot. In-
put levels below ground or above VCC
will be clamped beginning at –0.6 V and
VCC
+ 0.6 V. The device can withstand
indefinite operation with inputs in the
range of –0.5 V to +7.0 V. Device opera-
tion will not be adversely affected, how-
ever, input current levels will be well in
excess of 100 mA.
4. Actual test conditions may vary from
those designated but operation is guar-
anteed as specified.
5. Supply current for a given applica-
tion can be accurately approximated by:
where
N = total number of device outputs
C = capacitive load per output
V = supply voltage
F = clock frequency
6. Tested with all outputs changing ev-
ery cycle and no load, at a 30 MHz clock
rate.
7. Tested with all inputs within 0.1 V of
VCC
or Ground, no load.
8. These parameters are guaranteed
but not 100% tested.
NCV F
4
2
NOTES
9. AC specifications are tested with
input transition times less than 3 ns,
output reference levels of 1.5 V (except
tDIS
test), and input levels of nominally
0 to 3.0 V. Output loading may be a
resistive divider which provides for
specified IOH and IOL at an output
voltage of VOH min and VOL max
respectively.
Alternatively, a diode
bridge with upper and lower current
sources of IOH and IOL respectively,
and a balancing voltage of 1.5 V may be
used. Parasitic capacitance is 30 pF
minimum, and may be distributed.
This device has high-speed outputs ca-
pable of large instantaneous current
pulses and fast turn-on/turn-off times.
As a result, care must be exercised in the
testing of this device. The following
measures are recommended:
a. A 0.1 µF ceramic capacitor should be
installed between VCC and Ground
leads as close to the Device Under Test
(DUT) as possible. Similar capacitors
should be installed between device VCC
and the tester common, and device
ground and tester common.
b. Ground and VCC supply planes
must be brought directly to the DUT
socket or contactor fingers.
c. Input voltages should be adjusted to
compensate for inductive ground and VCC
noise to maintain required DUT input
levels relative to the DUT ground pin.
10. Each parameter is shown as a min-
imum or maximum value. Input re-
quirements are specified from the point
of view of the external system driving
the chip. Setup time, for example, is
specified as a minimum since the exter-
nal system must supply at least that
much time to meet the worst-case re-
quirements of all parts. Responses from
the internal circuitry are specified from
the point of view of the device. Output
delay, for example, is specified as a
maximum since worst-case operation of
any device always provides data within
that time.
11. For the tENA test, the transition is
measured to the 1.5 V crossing point
with datasheet loads. For the tDIS test,
the transition is measured to the
±200mV level from the measured
steady-state output voltage with
±10mA loads. The balancing volt-
age, VTH, is set at 3.5 V for Z-to-0
and 0-to-Z tests, and set at 0 V for Z-
to-1 and 1-to-Z tests.
12. These parameters are only tested at
the high temperature extreme, which is
the worst case for leakage current.
S1
IOH
IOL
VTH
CL
DUT
OE
0.2 V
tDIS
tENA
0.2 V
1.5 V
1.5 V
3.5V Vth
1
Z
0
Z
Z
1
Z
0
1.5 V
1.5 V
0V Vth
VOL*
VOH*
VOL*
VOH*
Measured VOL with IOH = –10mA and IOL = 10mA
Measured VOH with IOH = –10mA and IOL = 10mA
FIGURE B. THRESHOLD LEVELS
FIGURE A. OUTPUT LOADING CIRCUIT


Podobny numer części - LF2246

ProducentNumer częściArkusz danychSzczegółowy opis
logo
LOGIC Devices Incorpora...
LF2242 LODEV-LF2242 Datasheet
136Kb / 8P
   12/16-bit Half-Band Interpolating/ Decimating Digital Filter
LF2242JC25 LODEV-LF2242JC25 Datasheet
136Kb / 8P
   12/16-bit Half-Band Interpolating/ Decimating Digital Filter
LF2242JC33 LODEV-LF2242JC33 Datasheet
136Kb / 8P
   12/16-bit Half-Band Interpolating/ Decimating Digital Filter
LF2242QC25 LODEV-LF2242QC25 Datasheet
136Kb / 8P
   12/16-bit Half-Band Interpolating/ Decimating Digital Filter
LF2242QC33 LODEV-LF2242QC33 Datasheet
136Kb / 8P
   12/16-bit Half-Band Interpolating/ Decimating Digital Filter
More results

Podobny opis - LF2246

ProducentNumer częściArkusz danychSzczegółowy opis
logo
Cadeka Microcircuits LL...
TMC2246A CADEKA-TMC2246A Datasheet
373Kb / 18P
   Image Filter 11 x 10 bit, 60 MHz
logo
Fairchild Semiconductor
TMC2246A FAIRCHILD-TMC2246A Datasheet
266Kb / 18P
   Image Filter 11 x 10 bit, 60 MHz
logo
Intersil Corporation
HSP48901 INTERSIL-HSP48901_04 Datasheet
146Kb / 8P
   3 x 3 Image Filter
HSP48901 INTERSIL-HSP48901 Datasheet
62Kb / 9P
   3 x 3 Image Filter
logo
Renesas Technology Corp
HSP48901 RENESAS-HSP48901 Datasheet
305Kb / 8P
   3 x 3 Image Filter
July 2004
logo
LOGIC Devices Incorpora...
LF3338 LODEV-LF3338 Datasheet
303Kb / 15P
   8-Bit Vertical Digital Image Filter
logo
Panasonic Semiconductor
AN8133FHQ PANASONIC-AN8133FHQ Datasheet
192Kb / 4P
   10-bit A/D Converter for Image-processing
logo
NEC
UPD3725A NEC-UPD3725A Datasheet
183Kb / 22P
   5000-BIT x 3 CCD COLOR LINEAR IMAGE SENSOR
logo
Texas Instruments
LM9810 TI1-LM9810 Datasheet
290Kb / 22P
[Old version datasheet]   10/12-Bit Image Sensor Processor Analog Front End
logo
LOGIC Devices Incorpora...
LF3330 LODEV-LF3330 Datasheet
138Kb / 15P
   Vertical Digital Image Filter
More results


Html Pages

1 2 3 4 5 6 7


Arkusz danych Pobierz

Go To PDF Page


Link URL




Polityka prywatności
ALLDATASHEET.PL
Czy Alldatasheet okazała się pomocna?  [ DONATE ] 

O Alldatasheet   |   Reklama   |   Kontakt   |   Polityka prywatności   |   Linki   |   Lista producentów
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com