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UC1825A-DIE Arkusz danych(PDF) 1 Page - Texas Instruments |
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UC1825A-DIE Arkusz danych(HTML) 1 Page - Texas Instruments |
1 / 5 page UC1825A-DIE www.ti.com SLUSBL3 – JUNE 2013 RAD-TOLERANT, HIGH-SPEED PWM CONTROLLER Check for Samples: UC1825A-DIE 1 FEATURES • Rad-Tolerant: 30 kRad (Si) TID (1) • 50-ns Propagation Delay to Output • Compatible With Voltage-Mode or Current- • High-Current Dual Totem Pole Outputs Mode Control Methods • Trimmed Oscillator Discharge Current • Practical Operation at Switching Frequencies • Low 100- μA Startup Current • Pulse-by-Pulse Current Limiting Comparator (1) Radiation tolerance is a typical value based upon initial device • Latched Overcurrent Comparator With Full qualification with dose rate = 10 mrad/sec. Radiation Lot Acceptance Testing is available - contact factory for details. Cycle Restart DESCRIPTION The UC1825A-DIE PWM controller is an improved version of the standard UC1825 family. Performance enhancements have been made to several of the circuit blocks. Error amplifier gain bandwidth product is 12 MHz, while input offset voltage is 2 mV. Current limit threshold is assured to a tolerance of 5%. Oscillator discharge current is specified at 10 mA for accurate dead time control. Frequency accuracy is improved to 6%. Startup supply current, typically 100 μA, is ideal for off-line applications. The output drivers are redesigned to actively sink current during UVLO at no expense to the startup current specification. In addition each output is capable of 2-A peak currents during transitions. ORDERING INFORMATION(1) PACKAGE PRODUCT PACKAGE ORDERABLE PART NUMBER PACKAGE QUANTITY DESIGNATOR UC1825AVTD1 81 UC1825A TD Bare die in waffle pack(2) UC1825AVTD2 10 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
Podobny numer części - UC1825A-DIE_15 |
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Podobny opis - UC1825A-DIE_15 |
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