TS3USB30E

SCDS255F – DECEMBER 2008 – REVISED AUGUST 2015

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6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted) (see

MIN

MAX

UNIT

Supply voltage

–0.5

7

V

–0.5

7

V

–0.5

V

–0.5

5.25

Control input clamp current

–50

mA

I/O port clamp current

–50

mA

±64

mA

±100

mA

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions . Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltages are with respect to ground, unless otherwise specified.

(3)

The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

(4)

(5)

6.2 ESD Ratings

VALUE

UNIT

All pins

8000

Human body model (HBM),

I/O port to GND

15000

V

1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

See

MIN

MAX

UNIT

Supply voltage

3

4.3

V

1.3

High-level control input voltage

V

1.7

0

0.5

Low-level control input voltage

V

0

0.7

Data input/output voltage

0

V

Operating free-air temperature

–40

85

°C

(1)

Floating CMOS Inputs (SCBA004).

4

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