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LF2010-S Arkusz danych(PDF) 4 Page - LEM

Numer części LF2010-S
Szczegółowy opis  Bipolar and insulated current measurement up to 3 kA
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Producent  LEM [LEM]
Strona internetowa  http://www.lem.co.jp/HQ/en
Logo LEM - LEM

LF2010-S Arkusz danych(HTML) 4 Page - LEM

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8October2015/Version 1
LEM reserves the right to carry out modifications on its transducers, in order to improve them, without prior notice
www.lem.com
LF 2010-S
Electrical data
At T
A = 25 °C, ±UC = ±24 V, RM = 1 Ω, unless otherwise noted.
Lines with a * in the conditions column apply over the −40 … 85 °C ambient temperature range.
Parameter
Symbol Unit
Min
Typ
Max
Conditions
Primary nominal rms current
I
PN
A
2000 *
Primary current, measuring range
I
PM
A
−3000
3000 *
Measuring resistance
R
M
Ω
0
* Max value of R
M is given in figure 1
Secondary nominal rms current
I
SN
A
0.4
*
Resistance of secondary winding
R
S
Ω
18.6
R
S (TA) = RS × (1 + 0.004 × (TA + ∆temp−25))
Estimated temperature increase @I
PN is
∆temp = 15 °C
Secondary current
I
S
A
−0.6
0.6
*
Number of secondary turns
N
S
5000
Theoretical sensitivity
G
th
mA/A
0.2
Supply voltage
±U
C
V
±14.25
±25.2 *
Current consumption
I
C
mA
42 + I
S
48 + I
S
±U
C = ±15 V
±U
C = ±24 V
Offset current, referred to primary
I
O
A
−1
1
Temperature variation of I
O,
referred to primary
I
OT
A
−1
1
*
Magnetic offset current,
referred to primary
I
OM
A
±1
After 3 × I
PN
Sensitivity error
ε
G
%
−0.15
0.15
*
Linearity error
ε
L
% of I
PN
−0.1
0.1
*
Overall accuracy at I
PN
X
G
% of I
PN
−0.2
−0.3
0.2
0.3
*
25 … 70 … 85 °C
−40 … 85 °C
Output rms noise current referred
to primary
I
no
mA
90
1 Hz to 20 kHz (see figure 4)
Reaction time @ 10 % of I
PN
t
ra
µs
< 0.5
0 to 1 kA, 200 A/µs
Step response time to 90 % of I
PN
t
r
µs
< 0.5
0 to 1 kA, 200 A/µs
Frequency bandwidth
BW
kHz
150
−3 dB, small signal bandwidth
Definition of typical, minimum and maximum values
Minimum and maximum values for specified limiting and safety conditions have to be understood as such as well as values shown
in “typical” graphs.
On the other hand, measured values are part of a statistical distribution that can be specified by an interval with upper and lower
limits and a probability for measured values to lie within this interval.
Unless otherwise stated (e.g. “100 % tested”), the LEM definition for such intervals designated with “min” and “max” is that the
probability for values of samples to lie in this interval is 99.73 %.
For a normal (Gaussian) distribution, this corresponds to an interval between −3 sigma and +3 sigma. If “typical” values are not
obviously mean or average values, those values are defined to delimit intervals with a probability of 68.27 %, corresponding to an
interval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during the initial characterization of the product.


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