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CD4514BC Arkusz danych(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Numer części CD4514BC
Szczegółowy opis  4-Bit Latched/4-to-16 Line Decoders
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Producent  NSC [National Semiconductor (TI)]
Strona internetowa  http://www.national.com
Logo NSC - National Semiconductor (TI)

CD4514BC Arkusz danych(HTML) 3 Page - National Semiconductor (TI)

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DC Electrical Characteristics CD4514BC CD4515BC (Note 2) (Continued)
Symbol
Parameter
Conditions
b
40 C
a
25 C
a
85 C
Units
Min
Max
Min
Typ
Max
Min
Max
VIL
Low Level
lIOl k 1 mA
Input Voltage
VDD e 5V VO e 05V or 45V
15
225
15
15
V
VDD e 10V VO e 10V or 90V
30
450
30
30
V
VDD e 15V VO e 15V or 135V
40
675
40
40
V
VIH
High Level
lIOl k 1 mA
Input Voltage
VDD e 5V VO e 05V or 45V
35
35
275
35
V
VDD e 10V VO e 10V or 90V
70
70
550
70
V
VDD e 15V VO e 15V or 135V
110
110
825
110
V
IOL
Low Level Output
VDD e 5V VO e 04V
052
044
088
036
mA
Current (Note 3)
VDD e 10V VO e 05V
13
11
225
090
mA
VDD e 15V VO e 15V
36
30
88
24
mA
IOH
High Level Output
VDD e 5V VO e 46V
b
052
b
044
b
088
b
036
mA
Current (Note 3)
VDD e 10V VO e 95V
b
13
b
11
b
225
b
090
mA
VDD e 15V VO e 135V
b
36
b
30
b
88
b
24
mA
IIN
Input Current
VDD e 15V VIN e 0V
b
03
b
10b5
b
03
b
10
m
A
VDD e 15V VIN e 15V
03
10b5
03
10
m
A
AC Electrical Characteristics
All types CL e 50 pF TA e 25 C tr e tf e 20 ns unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
tTHL tTLH
Transition Times
VDD e 5V
100
200
ns
VDD e 10V
50
100
ns
VDD e 15V
40
80
ns
tPLH tPHL
Propagation Delay Times
VDD e 5V
550
1100
ns
VDD e 10V
225
450
ns
VDD e 15V
150
300
ns
tPLH tPHL
Inhibit Propagation
VDD e 5V
400
800
ns
Delay Times
VDD e 10V
150
300
ns
VDD e 15V
100
200
ns
tSU
Setup Time
VDD e 5V
125
250
ns
VDD e 10V
50
100
ns
VDD e 15V
38
75
ns
tWH
Strobe Pulse Width
VDD e 5V
175
350
ns
VDD e 10V
50
100
ns
VDD e 15V
38
75
ns
CPD
Power Dissipation Capacitance
Per Package (Note 5)
150
pF
CIN
Input Capacitance
Any Input (Note 4)
5
75
pF
AC Parameters are guaranteed by DC correlated testing
Note 1
‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits The tables of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteris-
tics’’ provide conditions for actual device operation
Note 2
VSS e 0V unless otherwise specified
Note 3
IOH and IOL are tested one output at a time
Note 4
Capacitance is guaranteed by periodic testing
Note 5
CPD determines the no load AC power consumption of any CMOS device For complete explanation see 54C and 74C Family Characteristics application
note AN-90
3


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