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TLP718 Arkusz danych(PDF) 5 Page - Toshiba Semiconductor |
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TLP718 Arkusz danych(HTML) 5 Page - Toshiba Semiconductor |
5 / 9 page TLP718 2015-10-13 5 Figure 7: Switching Time Test Circuit Figure 8: Switching Time Test Circuit Figure 9: Common-Mode Transient Immunity Test Circuit CMH (CML) is the maximum rate of rise (fall) of the common mode voltage that can be sustained with the output voltage in the high (low) state. Vo IF Vcc GND SHIELD CL tp HL IF Vo 50% VOL VOH tp LH t f t r 90% 10% 1.3 V 1.3 V 10% 90% CL: stray capacitance of probe and wiring (to 15 pF) IF = 3 mA(P.G) (f = 50 kHz , duty = 50% less than tr = tf = 5ns) CL: stray capacitance of probe and wiring (to 15 pF) 0.1 uF Vcc Vcc GND SHIELD Vo 0.1 uF CL Vcc IF 5 V 620 Ω 5k Ω tp HL IF 1.3 V Vo 50% VOL VOH tp LH IF = 3 mA(P.G) (f = 50 kHz , duty = 50% less than tr = tf = 5ns) ) s ( tr ) V ( H CM µ = 800 ) s ( t f ) V ( L CM µ − = 800 0.1 uF Vo Vcc 1 3 6 5 4 VCM B Vcc GND SHIELD 2 SW A → IF + - CML CMH VCM 90% 1000 V ・SW A : I F = 0 mA ・SW B : I F = 5 mA 1 V 17 V Vo tr tf 10% |
Podobny numer części - TLP718_15 |
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Podobny opis - TLP718_15 |
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