SN74AHC1G32

SCLS317O – MARCH 1996 – REVISED JULY 2014

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7 Specifications

7.1 Absolute Maximum Ratings

(1)

over operating free-air temperature range (unless otherwise noted)

MIN

MAX

UNIT

Supply voltage range

–0.5

7

V

–0.5

7

V

–0.5

V

Input clamp current

–20

mA

Output clamp current

±20

mA

Continuous output current

±25

mA

±50

mA

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

7.2 Handling Ratings

MIN

MAX

UNIT

Storage temperature range

–60

150

°C

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all

0

1500

Electrostatic discharge

V

Charged device model (CDM), per JEDEC specification

0

1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

2

5.5

V

1.5

High-level input voltage

2.1

V

3.85

0.5

Low-level input voltage

0.9

V

1.65

Input voltage

0

5.5

V

Output voltage

0

V

–50

µA

High-level output current

–4

mA

–8

50

µA

Low-level output current

4

mA

8

100

∆t/∆v

Input transition rise and fall rate

ns/V

20

Operating free-air temperature

–40

125

°C

(1)

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

4

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