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MC100EPT20 Arkusz danych(PDF) 4 Page - ON Semiconductor

Numer części MC100EPT20
Szczegółowy opis  3.3V LVTTL/LVCMOS to Differential LVPECL Translator
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Producent  ONSEMI [ON Semiconductor]
Strona internetowa  http://www.onsemi.com
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MC100EPT20 Arkusz danych(HTML) 4 Page - ON Semiconductor

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MC10EPT20, MC100EPT20
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Table 6. 100EPT PECL OUTPUT DC CHARACTERISTICS VCC = 3.3 V, GND = 0 V (Note 4)
−40
°C
25
°C
85
°C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
ICC
Negative Power Supply Current
20
25
30
22
27
32
23
28
33
mA
VOH
Output HIGH Voltage (Note 5)
2155
2280
2405
2155
2280
2405
2155
2280
2405
mV
VOL
Output LOW Voltage (Note 5)
1355
1480
1605
1355
1480
1605
1355
1480
1605
mV
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
4. Output parameters vary 1:1 with VCC.
5. All loading with 50
W to VCC − 2.0 V.
Table 7. AC CHARACTERISTICS VCC = 3.0 V to 3.6 V, GND = 0 V (Note 6)
−40
°C
25
°C
85
°C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
fmax
Maximum Input Clock Frequency
> 1
> 1
> 1
GHz
tPLH,
tPHL
Propagation Delay to
Output Differential
280
350
430
300
370
450
320
400
490
ps
tSKEW
Device−to−Device Skew (Note 7)
150
150
170
ps
tJITTER
RMS Random Clock Jitter
< 1
< 2
< 1
< 2
< 1
< 2
ps
tr
tf
Output Rise/Fall Times
Q, Q
(20% − 80%)
70
100
170
80
120
180
90
140
190
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
6. Measured using a LVTTL source, 50% duty cycle clock source. All loading with 50
W to VCC − 2.0 V.
7. Skew is measured between outputs under identical transitions.


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