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IDT70T633 Arkusz danych(PDF) 13 Page - Integrated Device Technology |
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IDT70T633 Arkusz danych(HTML) 13 Page - Integrated Device Technology |
13 / 27 page 13 IDT70T633/1S High-Speed 2.5V 512/256K x 18 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges RapidWrite Mode Write Cycle Unlike other vendors' Asynchronous Random Access Memories, the IDT70T633/1 is capable of performing multiple back-to-back write operations without having to pulse the R/W, CE, or BEn signals high duringaddresstransitions. ThisRapidWriteModefunctionalityallowsthe systemdesignertoachieveoptimumback-to-backwritecycleperformance without the difficult task of generating narrow reset pulses every cycle, simplifyingsystemdesignandreducingtimetomarket. DuringthisnewRapidWriteMode,theendofthewritecycleisnow definedbytheendingaddresstransition,insteadoftheR/WorCEorBEn transition to the inactive state. R/W, CE, and BEn can be held active throughout the address transition between write cycles. CaremustbetakentostillmeettheWriteCycletime(tWC),thetimein whichtheAddressinputsmustbestable. Inputdatasetupandholdtimes (tDW and tDH)willnowbereferencedtotheendingaddresstransition. In thisRapidWriteMode theI/OwillremainintheInputmodefortheduration of the operations due to R/W being held low. All standard Write Cycle specifications must be adhered to. However, tAS and tWR are only applicable when switching between read and write operations. Also, therearetwoadditionalconditionsontheAddressInputsthatmustalso bemettoensurecorrectaddresscontrolled writes. Thesespecifications, theAllowableAddressSkew(tAAS)andtheAddressRise/Falltime(tARF), mustbemettousetheRapidWriteMode. Iftheseconditionsarenotmet thereisthepotentialforinadvertentwriteoperationsatrandomintermediate locationsasthedevicetransitionsbetweenthedesiredwriteaddresses. 5670 drw 08 tWC tWC tWC tEW tWP tWZ tDH tDW tDW tDW tOW tWR ADDRESS CE or SEM(6) BEn R/ W DATAIN DATAOUT (2) (5) (5) tDH tDH (4) Timing Waveform of Write Cycle No. 3, RapidWrite Mode Write Cycle(1,3) NOTES: 1. OE = VIL for this timing waveform as shown. OE may equal VIH with same write functionality; I/O would then always be in High-Z state. 2. A write occurs during the overlap (tEW or tWP) of a CE = VIL, BEn = VIL, and a R/W = VIL for memory array writing cycle. The last transition LOW of CE, BEn, and R/W initiates the write sequence. The first transition HIGH of CE, BEn, and R/W terminates the write sequence. 3. If the CE or SEM = VIL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state. 4. The timing represented in this cycle can be repeated multiple times to execute sequential RapidWrite Mode writes. 5. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load (Figure 1). 6. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL. |
Podobny numer części - IDT70T633_12 |
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Podobny opis - IDT70T633_12 |
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