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IDT70T633 Arkusz danych(PDF) 13 Page - Integrated Device Technology

Numer części IDT70T633
Szczegółowy opis  HIGH-SPEED 2.5V 512/256K x 18 ASYNCHRONOUS DUAL-PORT STATIC RAM
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Producent  IDT [Integrated Device Technology]
Strona internetowa  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT70T633 Arkusz danych(HTML) 13 Page - Integrated Device Technology

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IDT70T633/1S
High-Speed 2.5V 512/256K x 18 Asynchronous Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
RapidWrite Mode Write Cycle
Unlike other vendors' Asynchronous Random Access Memories,
the IDT70T633/1 is capable of performing multiple back-to-back write
operations without having to pulse the R/W, CE, or BEn signals high
duringaddresstransitions. ThisRapidWriteModefunctionalityallowsthe
systemdesignertoachieveoptimumback-to-backwritecycleperformance
without the difficult task of generating narrow reset pulses every cycle,
simplifyingsystemdesignandreducingtimetomarket.
DuringthisnewRapidWriteMode,theendofthewritecycleisnow
definedbytheendingaddresstransition,insteadoftheR/WorCEorBEn
transition to the inactive state. R/W, CE, and BEn can be held active
throughout the address transition between write cycles.
CaremustbetakentostillmeettheWriteCycletime(tWC),thetimein
whichtheAddressinputsmustbestable. Inputdatasetupandholdtimes
(tDW and tDH)willnowbereferencedtotheendingaddresstransition. In
thisRapidWriteMode theI/OwillremainintheInputmodefortheduration
of the operations due to R/W being held low. All standard Write Cycle
specifications must be adhered to. However, tAS and tWR are only
applicable when switching between read and write operations. Also,
therearetwoadditionalconditionsontheAddressInputsthatmustalso
bemettoensurecorrectaddresscontrolled writes. Thesespecifications,
theAllowableAddressSkew(tAAS)andtheAddressRise/Falltime(tARF),
mustbemettousetheRapidWriteMode. Iftheseconditionsarenotmet
thereisthepotentialforinadvertentwriteoperationsatrandomintermediate
locationsasthedevicetransitionsbetweenthedesiredwriteaddresses.
5670 drw 08
tWC
tWC
tWC
tEW
tWP
tWZ
tDH
tDW
tDW
tDW
tOW
tWR
ADDRESS
CE or SEM(6)
BEn
R/
W
DATAIN
DATAOUT
(2)
(5)
(5)
tDH
tDH
(4)
Timing Waveform of Write Cycle No. 3, RapidWrite Mode Write Cycle(1,3)
NOTES:
1. OE = VIL for this timing waveform as shown. OE may equal VIH with same write functionality; I/O would then always be in High-Z state.
2. A write occurs during the overlap (tEW or tWP) of a CE = VIL, BEn = VIL, and a R/W = VIL for memory array writing cycle. The last transition LOW of CE, BEn, and
R/W initiates the write sequence. The first transition HIGH of CE, BEn, and R/W terminates the write sequence.
3. If the CE or SEM = VIL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state.
4. The timing represented in this cycle can be repeated multiple times to execute sequential RapidWrite Mode writes.
5. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 1).
6. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL
and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL.


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