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54LS502 Arkusz danych(PDF) 6 Page - National Semiconductor (TI) |
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54LS502 Arkusz danych(HTML) 6 Page - National Semiconductor (TI) |
6 / 6 page MICROCIRCUIT DATA SHEET MNDM54LS502-X REV 1A0 Revision History Rev ECN # Rel Date Originator Changes 1A0 M0002904 08/24/98 Linda Collins Initial MDS release:MNDM54LS502-X Rev. 1A0. Changed note 5 (Guaranteed, not tested) in the AC 50pF notes reference column to note 2 (Screen tested 100% at +25C, subgroup 9) & to note 4 (Sample tested at +25C, subgroup 9. Subgroups 10 & 11 are guaranteed, not tested). Changed note 2 in the AC 15pF notes reference column to note 5. Reworded the phrase in note 4 from 'and periodically at +125C & -55C, subgroups 10 & 11' to 'Subgroups 10 & 11 are guaranteed, not tested'. 6 |
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