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AD7896JRZ Arkusz danych(PDF) 4 Page - Analog Devices

Numer części AD7896JRZ
Szczegółowy opis  2.7 V to 5.5 V, 12-Bit ADC in 8-Lead SOIC/PDIP
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Strona internetowa  http://www.analog.com
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AD7896
–3–
Test Conditions/
Parameter
A Version
1
B Version
J Version
S Version Unit
Comments
POWER REQUIREMENTS
VDD
2.7/5.5
2.7/5.5
2.7/5.5
2.7/5.5
V min/max
IDD
444
4
mA max
Digital Input @ DGND,
VDD = 2.7 V to 3.6 V
555
5
mA max
Digital Inputs @ DGND,
VDD = 5 V
± 10%
Power Dissipation
10.8
10.8
10.8
10.8
mW max
VDD = 2.7 V, Typically 9 mW
Power-Down Mode
Digital Inputs @ DGND
IDD @ 25
°C
555 typ
5
µA max
VDD = 2.7 V to 3.6 V
TMIN to TMAX
15
15
75
75
µA max
VDD = 2.7 V to 3.6 V
IDD @ 25
°C50
5050
50
µA max
VDD = 5 V
± 10%
TMIN to TMAX
150
150
500
500
µA max
VDD = 5 V
± 10%
Power Dissipation @ 25
°C
13.5
13.5
13.5
13.5
µW max
VDD = 2.7 V
NOTES
1Temperature ranges are as follows: A, B Versions: –40
°C to +85°C; J Version: 0°C to +70°C; S Version: –55°C to +125°C.
2Applies to Mode 1 operation. See the section on Operating Modes.
3See Terminology.
4Sample tested @ 25
°C to ensure compliance.
5This 14
µs includes the wake-up time from standby. This wake-up time is timed from the rising edge of CONVST, whereas conversion is timed from the falling edge
of
CONVST, for narrow CONVST pulsewidth the conversion time is effectively the wake-up time plus conversion time, hence 14
µs. This can be seen from Figure 3.
Note that if the
CONVST pulsewidth is greater than 6
µs, the effective conversion time will increase beyond 14 µs.
Specifications subject to change without notice.
Parameter
A, B Versions
J Version
S Version
Unit
Test Conditions/Comments
t1
40
40
40
ns min
CONVST Pulsewidth
t2
40
2
40
2
45
2
ns min
SCLK High Pulsewidth
t3
40
2
40
2
45
2
ns min
SCLK Low Pulsewidth
t4
Data Access Time after Falling Edge of SCLK
60
3
60
3
70
3
ns max
VDD = 5 V
± 10%
100
3
100
3
110
3
ns max
VDD = 2.7 V to 3.6 V
t5
10
10
10
ns min
Data Hold Time after Falling Edge of SCLK
t6
50
4
50
4
50
4
ns max
Bus Relinquish Time after Falling Edge of SCLK
NOTES
1Sample tested at 25
°C to ensure compliance. All input signals are measured with tr = tf = 1 ns (10% to 90% of V
DD) and timed from a voltage level of 1.4 V.
2The SCLK maximum frequency is 10 MHz. Care must be taken when interfacing to account for the data access time, t
4, and the setup time required for the user’s
processor. These two times will determine the maximum SCLK frequency that the user’s system can operate with. See Serial Interface section for more information.
3Measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2 V.
4Derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then extrapolated back
to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t 6, quoted in the timing characteristics is the true bus relinquish time
of the part and as such is independent of external bus loading capacitances.
TIMING CHARACTERISTICS1 (VDD = 2.7 V to 5.5 V, AGND = DGND = 0 V)
1.6V
1.6mA
400 A
50pF
TO
OUTPUT
PIN
Figure 1. Load Circuit for Access Time and Bus
Relinquish Time
Rev. D


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