IRF1324S-7PPbF

7

2015-10-15

 

Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs

Fig 18a. Unclamped Inductive Test Circuit

Fig 18b. Unclamped Inductive Waveforms

Fig 19a. Switching Time Test Circuit

Fig 20a. Gate Charge Test Circuit

Fig 20b. Gate Charge Waveform

R G

IAS

0.01



tp

D.U.T

L

VDS

+

- VDD

DRIVER

A

15V

20V

tp

Fig 19b. Switching Time Waveforms

Vds

Vgs

Id

Vgs(th)

Qgs1 Qgs2

Qgd

Qgodr