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DM54LS107AJ Arkusz danych(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Numer części DM54LS107AJ
Szczegółowy opis  Dual Negative-Edge- Triggered Master-Slave J-K Flip-Flops with Clear and Complementary Outputs
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Producent  NSC [National Semiconductor (TI)]
Strona internetowa  http://www.national.com
Logo NSC - National Semiconductor (TI)

DM54LS107AJ Arkusz danych(HTML) 3 Page - National Semiconductor (TI)

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Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted) (Continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
(Note 1)
IIH
High Level Input
VCC e Max
J K
20
Current
VI e 27V
Clear
60
m
A
Clock
80
IIL
Low Level Input
VCC e Max
J K
b
04
Current
VI e 04V
Clear
b
08
mA
Clock
b
08
IOS
Short Circuit
VCC e Max
DM54
b
20
b
100
mA
Output Current
(Note 2)
DM74
b
20
b
100
ICC
Supply Current
VCC e Max (Note 3)
4
6
mA
Switching Characteristics at VCC e 5V and TA e 25 C (See Section 1 for Test Waveforms and Output Load)
From (Input)
RL e 2kX
Symbol
Parameter
To (Output)
CL e 15 pF
CL e 50 pF
Units
Min
Max
Min
Max
fMAX
Maximum Clock
30
25
MHz
Frequency
tPLH
Propagation Delay Time
Preset
20
24
ns
Low to High Level Output
to Q
tPHL
Propagation Delay Time
Preset
20
28
ns
High to Low Level Output
to Q
tPLH
Propagation Delay Time
Clear
20
24
ns
Low to High Level Output
to Q
tPHL
Propagation Delay Time
Clear
20
28
ns
High to Low Level Output
to Q
tPLH
Propagation Delay Time
Clock to
20
24
ns
Low to High Level Output
Q or Q
tPHL
Propagation Delay Time
Clock to
20
28
ns
High to Low Level Output
Q or Q
Note 1
All typicals are at VCC e 5V TA e 25 C
Note 2
Not more than one output should be shorted at a time and the duration should not exceed one second For devices with feedback from the outputs where
shorting the outputs to ground may cause the outputs to change logic state an equivalent test may be performed where VO e 225V and 2125V for DM54 and
DM74 series respectively with the minimum and maximum limits reduced by one half from their stated values This is very useful when using automatic test
equipment
Note 3
With all inputs open ICC is measured with the Q and Q outputs high in turn At the time of measurement the clock is grounded
3


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