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CRXXXXA-AS Dane(HTML) 5 Page - Bourns Electronic Solutions

Numer części CRXXXXA-AS
Szczegółowy opis  Sulfur-Resistant, AEC-Q200 Compliant Chip Resistors
Pobierz  11 Pages
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Producent  BOURNS [Bourns Electronic Solutions]
Strona internetowa  http://www.bourns.com
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CRXXXXA-AS Datasheet(Arkusz danych) 5 Page - Bourns Electronic Solutions

 
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Specificationsaresubjecttochangewithoutnotice.Usersshouldverifyactualdeviceperformanceintheirspecificapplications.
Theproductsdescribedhereinandthisdocumentaresubjecttospecificlegaldisclaimersassetforthonthelastpageofthisdocument,andatwww.bourns.com/docs/legal/disclaimer.pdf.
CRxxxxA-AS - Sulfur-Resistant, AEC-Q200 Compliant Chip Resistors
Performance Characteristics (AEC-Q200)
Test
Method
Procedure
Test Limits ∆R
Short Time Overload
IEC 60115-1 4.13
2.5 X rated voltage for 5 sec.
± (1 % + 0.05 Ω )
Remarks:
0201: ± (3 % + 0.1 Ω)
0402: ± (2 % + 0.1 Ω)
0 Ω : 50 mΩ or less
High Temperature Exposure
(Storage)
AEC-Q200-REV D-Test 3
MIL-STD-202 Method 108
1000 hrs. @ T=155 °C. Unpowered.
Measurement at 24 ±2 hours after test conclusion.
1 %: ± (1.0 % + 0.05 Ω)
5 %: ± (2.0 % + 0.1 Ω)
0201: ± (3 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Temperature Cycling
AEC-Q200-REV D-Test 4
JESD22 Method JA-104
1000 cycles (-55 °C to +125 °C)
Measurement at 24 ±4 hours after test conclusion.
30 min. maximum dwell time at each temperature extreme.
1 min. maximum transition time.
± (1.0 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Moisture Resistance
AEC-Q200-REV D-Test 6
MIL-STD-202 Method 106
T=24 hours / Cycle,10 Cycles.
Notes: Steps 7a & 7b not required. Unpowered.
1 %: ± (1.0 % + 0.05 Ω)
2 %, 5 %: ± (2.0 % + 0.1 Ω)
0201: ± (3 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Biased Humidity
AEC-Q200-REV D-Test 7
MIL-STD-202 Method 103
1000 hours 85 °C / 85 % RH. Note: Specified conditions:
10 % of operating power (not exceeding max. working voltage).
Measurement at 24 ±2 hours after test conclusion.
± (3 % + 0.1 Ω)
0201: ± (5 % + 0.1 Ω)
0 Ω: 100 mΩ or less
Operational Life
AEC-Q200-REV D-Test 8
MIL-STD-202 Method 108
1000 hours Ta=125 °C at 35 % rated power. Measurement at 24 ±4
hours after test conclusion.
1 %: ± (1 % + 0.1 Ω)
5 %: ± (3 % + 0.1 Ω)
0201: ± (5 % + 0.1 Ω)
0 Ω: 100 mΩ or less
External Visual
AEC-Q200-REV D-Test 9
MIL-STD-883 Method 2009
Electrical test not required. Inspect device construction, marking and
workmanship.
Physical Dimension
AEC-Q200-REV D-Test 10
JESD22 Method JB-100
Verify physical dimensions to the applicable device detail spec.
Note: User(s) and Suppliers spec. Electrical test not required.
Resistance to Solvents
AEC-Q200-REV D-Test 12
MIL-STD-202 Method 215
a: Isopropyl Alcohol : Mineral Spirits = 1:3
b: Terpene Defluxer (Bioact EC-7R)
c: Deionized water : Propylene Glycol
Monomethyl Ether : monoethanolamine = 42:1:1
Marking and protective layer
cannot be detached
Mechanical Shock
AEC-Q200-REV D-Test 13
MIL-STD-202 Method 213
Wave Form: Tolerance for half sine shock pulse. Peak value is
100 grams. Normal duration (D) is 6 ms.
± (1 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Vibration
AEC-Q200-REV D-Test 14
MIL-STD-202 Method 204
5 grams for 20 min., 12 cycles each of 3 orientations.
Note: Test from 10-2000 Hz.
± (1 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Resistance to
Soldering Heat
AEC-Q200-REV D-Test 15
MIL-STD-202 Method 210
Condition B: Immerse the specimens in and eutectic solder at
260 ±5 ℃ for 10 ±1 S.
1 %: ± (0.5 % + 0.05 Ω)
5 %: ± (1 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Thermal Shock
AEC-Q200-REV D-Test 16
MIL-STD-202 Method 107
-55 °C / +155 °C. Note: Number of cycles required: 1000, Maximum
transfer time: 20 seconds,
Dwell time: 15 minutes. Air to Air.
± (1 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
0 Ω: 50 mΩ or less
ESD
AEC-Q200-REV D-Test 17
Verify the voltage setting at 500 V
± (1 % + 0.1 Ω)
0201: ± (2 % + 0.1 Ω)
Solderability
AEC-Q200-REV D-Test 18
J-STD-002
Method B, aging 4 hours at 155 °C dry heat
Lead-free solder bath at 235 ±3 °C
Dipping time: 3 ±0.5 seconds
> 95 % area covered with tin
Flammability
AEC-Q200-REV D-Test 17
UL-94
V-0 or V-1 are acceptable.
Electrical test not required.
V-0 or V-1
Board Flex
(Bending)
AEC-Q200-REV D-Test 21
The duration of the applied forces shall be 60 (±5) seconds.
3 mm deflection (0201~1210)
2 mm deflection (2010~2512)
1 %: ± (0.5 % + 0.05 Ω)
5 %: ± (1 % + 0.1 Ω)
0201: ± (1 % + 0.1 Ω)
0 Ω: 50 mΩ or less
Terminal Strength
(SMD)
IEC 60115-1 4.32
Force of 1.8 kg for 60 seconds.
Note: 0201= N/A
± (0.5 % + 0.05 Ω)
0 Ω: 50 mΩ or less
Sulfuration Test
ASTM-B-809-95
Sulfur (saturated vapor) 1,000 hours,
105 ±2 °C, unpowered
1 %: ± (1 % + 0.05 Ω)
5 %: ± (2 % + 0.05 Ω)
0201:
1 %: ± (2 % + 0.05 Ω)
5 %: ± (3 % + 0.05 Ω)
0 Ω: 100 mΩ or less


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