Zakładka z wyszukiwarką danych komponentów |
|
RU6H11R Arkusz danych(PDF) 6 Page - VBsemi Electronics Co.,Ltd |
|
RU6H11R Arkusz danych(HTML) 6 Page - VBsemi Electronics Co.,Ltd |
6 / 10 page Fig. 18 - For N-Channel P.W. Period dI/dt Diode recovery dV/dt Ripple ≤ 5 % Body diode forward drop Re-applied voltage Reverse recovery current Body diode forward current V GS = 10 V a I SD Driver gate drive D.U.T. l SD waveform D.U.T. V DS waveform Inductor current D = P.W. Period + - + + + - - - Peak Diode Recovery dV/dt Test Circuit V DD • dV/dt controlled by R g • Driver same type as D.U.T. • I SD controlled by duty factor “D” • D.U.T. - device under test D.U.T. Circuit layout considerations • Low stray inductance • Ground plane • Low leakage inductance current transformer R g Note a. V GS = 5 V for logic level devices V DD E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw RU6H11R 6 |
Podobny numer części - RU6H11R |
|
Podobny opis - RU6H11R |
|
|
Link URL |
Polityka prywatności |
ALLDATASHEET.PL |
Czy Alldatasheet okazała się pomocna? [ DONATE ] |
O Alldatasheet | Reklama | Kontakt | Polityka prywatności | Linki | Lista producentów All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |