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AM7945JC Arkusz danych(PDF) 5 Page - Advanced Micro Devices |
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AM7945JC Arkusz danych(HTML) 5 Page - Advanced Micro Devices |
5 / 18 page SLIC Products 5 ABSOLUTE MAXIMUM RATINGS Storage temperature . . . . . . . . . . . . –55°C to +150°C With respect to AGND/DGND: VCC. . . . . . . . . . . . . . . . . . . . . . . . . . .–0.4 V to +7.0 V VEE. . . . . . . . . . . . . . . . . . . . . . . . . . .+0.4 V to –7.0 V VBAT Continuous . . . . . . . . . . . . . . . . . . +0.4 V to –70 V 10 ms . . . . . . . . . . . . . . . . . . . . . . +0.4 V to –75 V BGND. . . . . . . . . . . . . . . . . . . . . . . . . . . .+3 V to –3 V A(TIP) or B(RING) with respect to BGND: Continuous . . . . . . . . . . . . . . . . . . . . –70 V to +1 V 10 ms (f = 0.1 Hz) . . . . . . . . . . . . . . . –70 V to +5 V 1 ms (f = 0.1 Hz) . . . . . . . . . . . . . . . . –80 V to +8 V 10 µs (f = 0.1 Hz) . . . . . . . . . . . . . –100 V to +12 V Current from A(TIP) or B(RING). . . . . . . . . . ±150 mA Current from TMG . . . . . . . . . . . . . . . . . . . . . 100 mA Voltage on RINGOUT: During transient . . . . . . . . . . . . . . BGND to +10 V During steady state . . . . . . . . . . . . . BGND to +7 V Current through relay drivers . . . . . . . . . . . . . . 60 mA DA and DB inputs Voltage on ring-trip inputs . . . . . . . . . . .VBAT to 0 V Current into ring-trip inputs . . . . . . . . . . . . ±10 mA C3–C1, E0, E1 to AGND/DGND . . . . . . . . . –0.4 V to VCC + 0.4 V Maximum power dissipation, TA = 85°C No heat sink (See note): In 32-pin PLCC package. . . . . . . . . . . . . . . . 1.4 W Thermal data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . θ JA In 32-pin PLCC package. . . . . . . . . . . .43°C/W typ Note: Thermal limiting circuitry on chip will shut down the cir- cuit at a junction temperature of about 165°C. The device should never be exposed to this temperature. Operation above 145°C junction temperature may degrade device reliability. See the SLIC Packaging Considerations for more information. Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. OPERATING RANGES Commercial (C) Devices Ambient temperature . . . . . . . . . . . . . . 0°C to +70°C* VCC . . . . . . . . . . . . . . . . . . . . . . . . . . .4.75 V to 5.25 V VEE . . . . . . . . . . . . . . . . . . . . . . . . .–4.75 V to –5.25 V VBAT . . . . . . . . . . . . . . . . . . . . . . . . . –19 V to –56.5 V AGND/DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V BGND with respect to AGND/DGND . . . . . . . . . . . –100 mV to +100 mV Load resistance on VTX to GND . . . . . . . . 10 k Ω min The Operating Ranges define those limits over which the functionality of the device is guaranteed by production testing. * Functionality of the device from 0 °C to +70°C is guaranteed by production testing. Performance from –40°C to +85°C is guaranteed by characterization and periodic sampling of pro- duction units. |
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