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AD5535 Arkusz danych(PDF) 9 Page - Analog Devices

Numer części AD5535
Szczegółowy opis  32-Channel, 14-Bit DAC with Full-Scale Output Voltage Programmable from 50 V to 200 V
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Strona internetowa  http://www.analog.com
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AD5535 Arkusz danych(HTML) 9 Page - Analog Devices

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Preliminary Technical Data
AD5535
Rev. PrE | Page 9 of 16
TERMINOLOGY
Integral Nonlinearity (INL)
A measure of the maximum deviation from a straight line
passing through the endpoints of the DAC transfer function. It
is expressed as a percentage of full-scale range.
Differential Nonlinearity (DNL)
The difference between the measured change and the ideal
1 LSB change between any two adjacent codes. A specified DNL
of ±1 LSB maximum ensures monotonicity.
Zero-Code Voltage
A measure of the output voltage present at the device output
with all 0s loaded to the DAC. It includes the offset of the DAC
and the output amplifier. It is expressed in V.
Offset Error
Calculated by taking two points in the linear region of the
transfer function, drawing a line through these points, and
extrapolating back to the Y axis. It is expressed in mV.
Voltage Gain
Calculated from the change in output voltage for a change in
code multiplied by 16,384 and divided by the REF_IN voltage.
This is calculated between two points in the linear section of the
transfer function.
Gain Error
A measure of the output error with all 1s loaded to the DAC,
and is the difference between the ideal and actual analog output
range. Ideally, the output should be 50 × REF_IN. It is expressed
as a percentage of full-scale range.
DC Power-Supply Rejection Ratio (PSRR)
A measure of the change in analog output for a change in VPP
supply voltage. It is expressed in dB. VPP is varied ±5%.
DC Crosstalk
The dc change in the output level of one DAC at midscale in
response to a full-scale code change (all 0s to all 1s and vice
versa) and the output change of all other DACs. It is expressed
in LSB.
Output Temperature Coefficient
A measure of the change in analog output with changes in
temperature. It is expressed in ppm/°C.
Output Voltage Settling Time
The time taken from when the last data bit is clocked into the
DAC until the output has settled to within ±0.5 LSB of its final
value.
Digital-to-Analog Glitch Impulse
The area of the glitch injected into the analog output when the
code in the DAC register changes state. It is specified as the area
of the glitch in nV–s, when the digital code is changed by 1 LSB
at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . .
00 to 011 . . . 11).
Digital Crosstalk
The glitch impulse transferred to the output of one DAC at
midscale while a full-scale code change (all 1s to all 0s and
vice versa) is being written to another DAC. It is expressed
in nV–s.
Analog Crosstalk
The area of the glitch transferred to the output (VOUT) of one
DAC due to a full-scale change in the output (VOUT) of another
DAC. The area of the glitch is expressed in nV–s.
Digital Feedthrough
A measure of the impulse injected into the analog outputs from
the digital control inputs when the part is not being written to
(SYNC is high). It is specified in nV–s and is measured with a
worst-case change on the digital input pins, for example, from
all 0s to all 1s and vice versa.
Output Noise Spectral Density
A measure of internally generated random noise. Random noise
is characterized as a spectral density (voltage per √Hz). It is
measured by loading all DACs to midscale and measuring noise
at the output. It is measured in nV/(Hz)1/2.


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