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ADXRS401 Arkusz danych(PDF) 1 Page - Analog Devices

Numer części ADXRS401
Szczegółowy opis  -75/s Single Chip Yaw Rate Gyro with Signal Conditioning
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±75°/s Single Chip Yaw Rate
Gyro with Signal Conditioning
ADXRS401
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703
© 2004 Analog Devices, Inc. All rights reserved.
FEATURES
Complete rate gyroscope on a single chip
Z-axis (yaw-rate) response
High vibration rejection over wide frequency
2000 g powered shock survivability
Self-test on digital command
Temperature sensor output
Precision voltage reference output
Absolute rate output for precision applications
5 V single-supply operation
Ultra small and light (< 0.15 cc, < 0.5 gram)
APPLICATIONS
GPS navigation systems
Image stabilization
Inertial measurement units
Platform stabilization
GENERAL DESCRIPTION
The ADXRS401 is a functionally complete and low cost angular
rate sensor (gyroscope), integrated with all of the required
electronics on one chip. It is manufactured using Analog
Devices’ surface-micromachining technique, the same high
volume BIMOS process used for high reliability automotive
airbag accelerometers. It is available in a 7 mm × 7 mm × 3 mm
BGA surface-mount package.
The output signal, RATEOUT (1B, 2A), is a voltage proportional
to angular rate about the axis normal to the top surface of the
package (see Figure 2). A single external resistor can be used to
lower the scale factor. An external capacitor is used to set the
bandwidth. Other external capacitors are required for operation
(see Figure 1).
A precision reference and a temperature output are also
provided for compensation techniques. Two digital self-test
inputs electromechanically excite the sensor to test proper
operation of both sensors and the signal conditioning circuits.
FUNCTIONAL BLOCK DIAGRAM
5G
4G
3A
5V
2G
1F
7F
6A
7D
7C
7B
1C
4A
5A
7E
6G
1D
2A
1E
3G
1B
PDD
12V
+
ADXRS401
1
µF
22nF
100nF
22nF
CP2
CP1
PGND
CP4
CP3
CP5
CHARGE PUMP/REG.
TEMP
PTAT
RATEOUT
2.5V
π DEMOD
RATE
SENSOR
SELF
TEST
100nF
100nF
CMID
AGND
AVCC
ST1
ST2
CORIOLIS SIGNAL CHANNEL
SSEN2
RSEN1
COUT
ROUT
180k
Ω 1%
9kΩ ±35% 9kΩ ±35%
SUMJ
2.5V REF
RESONATOR LOOP
Figure 1.


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