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74F828 Arkusz danych(PDF) 5 Page - NXP Semiconductors |
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74F828 Arkusz danych(HTML) 5 Page - NXP Semiconductors |
5 / 12 page Philips Semiconductors Product specification 74F827, 74F828 Buffers 1994 Dec 05 5 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER Min Nom Max UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –24 mA IOL Low-level output current 64 mA Tamb Operating free-air temperature range 0 +70 °C DC ELECTRICAL CHARACTERISTICS Over recommended operating free-air temperature range unless otherwise noted. SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT SYMBOL PARAMETER TEST CONDITIONS MIN TYP2 MAX UNIT MIN TYP MAX VCC = MIN, VIL = MAX IOH = –15mA "10%VCC 2.4 V VOH High-level output voltage VIL = MAX, VIH = MIN IOH = –15mA "5%VCC 2.4 3.3 V VOH High-level out ut voltage VCC = MIN, VIL = MAX IOH = –24mA "10%VCC 2.0 V VIL = MAX, VIH = MIN IOH = –24mA "5%VCC 2.0 V VOL Low-level output voltage VCC = MIN, VIL = MAX, IOL MAX "10%VCC 0.55 V VOL Low-level out ut voltage VIL = MAX, VIH = MIN IOL = MAX "5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –20 µA IOZH Off-state output current, High voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short circuit output current3 VCC = MAX –100 –225 mA ICCH 50 70 mA 74F827 ICCL VCC = MAX 70 100 mA ICC Supply current ICCZ 60 90 mA ICC y (total) ICCH 30 45 mA 74F828 ICCL VCC = MAX 65 85 mA ICCZ 55 70 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under operating conditions for the applicable type. 2. All typical values are at VCC = 5V, TA = 25°C. 3. Not more than one output should be shorted at one time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
Podobny numer części - 74F828 |
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Podobny opis - 74F828 |
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