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74F828 Arkusz danych(PDF) 5 Page - NXP Semiconductors

Numer części 74F828
Szczegółowy opis  10-bit buffer/line driver, non-inverting 3-State
Download  12 Pages
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Producent  PHILIPS [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F828 Arkusz danych(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F827, 74F828
Buffers
1994 Dec 05
5
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
Min
Nom
Max
UNIT
VCC
Supply voltage
4.5
5.0
5.5
V
VIH
High-level input voltage
2.0
V
VIL
Low-level input voltage
0.8
V
IIK
Input clamp current
–18
mA
IOH
High-level output current
–24
mA
IOL
Low-level output current
64
mA
Tamb
Operating free-air temperature range
0
+70
°C
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP2
MAX
UNIT
MIN
TYP
MAX
VCC = MIN,
VIL = MAX
IOH = –15mA
"10%VCC
2.4
V
VOH
High-level output voltage
VIL = MAX,
VIH = MIN
IOH = –15mA
"5%VCC
2.4
3.3
V
VOH
High-level out ut voltage
VCC = MIN,
VIL = MAX
IOH = –24mA
"10%VCC
2.0
V
VIL = MAX,
VIH = MIN
IOH = –24mA
"5%VCC
2.0
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX,
IOL MAX
"10%VCC
0.55
V
VOL
Low-level out ut voltage
VIL = MAX,
VIH = MIN
IOL = MAX
"5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–20
µA
IOZH
Off-state output current,
High voltage applied
VCC = MAX, VO = 2.7V
50
µA
IOZL
Off-state output current,
Low voltage applied
VCC = MAX, VO = 0.5V
–50
µA
IOS
Short circuit output current3
VCC = MAX
–100
–225
mA
ICCH
50
70
mA
74F827
ICCL
VCC = MAX
70
100
mA
ICC
Supply current
ICCZ
60
90
mA
ICC
y
(total)
ICCH
30
45
mA
74F828
ICCL
VCC = MAX
65
85
mA
ICCZ
55
70
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under operating conditions for the applicable type.
2. All typical values are at VCC = 5V, TA = 25°C.
3. Not more than one output should be shorted at one time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.


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