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MC10E155FN Arkusz danych(PDF) 5 Page - ON Semiconductor

Numer części MC10E155FN
Szczegółowy opis  5V ECL 6?묪it 2:1 Mux?묹atch
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MC10E155FN Arkusz danych(HTML) 5 Page - ON Semiconductor

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MC10E155, MC100E155
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Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9)
Symbol
Characteristic
0°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
fMAX
Maximum Toggle Frequency
700
1100
700
1100
700
1100
MHz
tPLH
tPHL
Propagation Delay to Output
D
SEL
LEN
MR
325
475
350
450
500
675
500
600
700
925
750
850
325
475
350
450
500
675
500
600
700
925
750
850
325
475
350
450
500
675
500
600
700
925
750
850
ps
ts
Setup Time
D
SEL
300
500
100
250
300
500
100
250
300
500
100
250
ps
th
Hold Time
D
SEL
300
0
−100
−250
300
0
−100
−250
300
0
−100
−250
ps
tRR
Reset Recovery Time
800
650
800
650
800
650
ps
tPW
Minimum Pulse Width
MR
400
400
400
ps
tSKEW
Within-Device Skew (Note 10)
75
75
75
ps
tJITTER
Random Clock Jitter (RMS)
< 1
< 1
< 1
ps
tr
tf
Rise/Fall Time
(20 - 80%)
300
450
800
300
450
800
300
450
800
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
10.Within-device skew is defined as identical transitions on similar paths through a device.
Figure 3. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
Driver
Device
Receiver
Device
QD
Q
D
Zo = 50 W
Zo = 50 W
50 W
50 W
VTT
VTT = VCC − 2.0 V


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