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ABSOLUTE MAXIMUM RATINGS

(1)

DAC8881

SBAS422A – JULY 2007 – REVISED SEPTEMBER 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SPECIFIED

PACKAGE-

PACKAGE

TEMPERATURE

PACKAGE

PRODUCT

LEAD

DESIGNATOR

RANGE

MARKING

DAC8881

QFN-24

RGE

–40

°C to +105°C

DAC8881

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI

website at www.ti.com.

Over operating free-air temperature range (unless otherwise noted).

DAC8881

UNIT

–0.3 to 6

V

–0.3 to 6

V

–0.3 to 6

V

Digital input voltage to DGND

V

V

Operating temperature range

–40 to +105

°C

Storage temperature range

–65 to +150

°C

+150

°C

Human body model (HBM)

3000

V

ESD ratings

Charged device model (CDM)

1000

V

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

2

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